Artículos relacionados a Reliability Modelling with Information Measures

Reliability Modelling with Information Measures - Tapa dura

Nair, N. Unnikrishnan; Sunoj, S.M.; Rajesh, G.

 
9781032314136: Reliability Modelling with Information Measures
Tapa dura
ISBN 10: 1032314133 ISBN 13: 9781032314136
Editorial: CRC Press, 2022

Sinopsis

The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis. This is an emerging area of study and research during the last two decades and is of potential interest in many fields. In this work the classical measures of uncertainty are sufficiently modified to meet the needs of lifetime data analysis. The book provides an exhaustive collection of materials in a single volume to make it a comprehensive source of reference.

The first treatise on the subject. It brings together the work that have appeared in journals on different disciplines. It will serve as a text for graduate students and practioners of special studies in information theory, as well as statistics and as a reference book for researchers. The book contains illustrative examples, tables and figures for clarifying the concepts and methodologies, the book is self-contained. It helps students to access information relevant to careers in industry, engineering, applied statistics, etc.

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Acerca del autor

N. Unnikrishnan Nair gained his Ph.D from the University of Kerala, India and was conferred the degree of Doctor of Humane Letters by Juniata College, USA. He is a Fellow of the Indian Society for Probability and Statistics and its past President. He was also a member of the International Statistical Institute. Nair was the Professor and Chair of the Department of Statistics of the Cochin University of Science and Technology, India, and Dean, Faculty of Science. He also served the University as its Vice Chancellor. He has published six books of which he is the leading author of two recent titles, Quantile-based Reliability Analysis by Birkhauser and Reliability Modeling and Analysis in Discrete Time by Academic Press. He has published over 170 papers in refereed international journals.

S.M. Sunoj gained his Ph.D from the Cochin University of Science and Technology, India. He is the Professor of Department of Statistics, Cochin University of Science and Technology. He has published over 65 papers in refereed international journals. He is an elected member of the International Statistical Institute. He is currently the Associate Editor of the Journal of the Indian Society for Probability and Statistics, India. His areas of research include distribution theory, reliability theory and information measures.

G. Rajesh is the Professor of the Department of Statistics, Cochin University of Science and Technology, India. He received his Ph.D from the Department of Statistics, Cochin University of Science and Technology, India. His main areas of research include distribution theory, information measures and non-parametric inferences. He has published more than 50 research papers in refereed international journals.

De la contraportada

The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
CRC Press
Año de publicación
2022
Idioma
Inglés
ISBN 10 
1032314133
ISBN 13 
9781032314136
Encuadernación
Tapa dura
Número de edición
1
Número de páginas
346
Contacto del fabricante
Taylor and Francis, GPSR Taylor and Francis
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