Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware - Tapa blanda

Smith, David John

9780951656266: Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware

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ISBN 10: 0951656260 ISBN 13: 9780951656266

Editorial: Technis, 2000

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Editorial: Technis
A�o de publicaci�n: 2000
Idioma: Ingl�s
ISBN 10: 0951656260
ISBN 13: 9780951656266
Encuadernaci�n: Tapa blanda
N�mero de p�ginas: 180
Contacto del fabricante: no disponible
Persona responsable: no disponible

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Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware

Smith, David John

Publicado por Technis, 2000

ISBN 10: 0951656260 ISBN 13: 9780951656266

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Librería: BoundlessBookstore, Wallingford, Reino Unido

Calificaci�n del vendedor: 5 de 5 estrellas

Condici�n: Good. Signed with gift message. Good condition paperback. Book content is clean and bright. Covers have light wear. There will be no loose pages. N� de ref. del art�culo: 9999-9993500665

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Smith, David John

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