Librería: SUNSET BOOKS 2, Newark, OH, Estados Unidos de America
Paperback. Condición: Very Good. No Jacket. 1st. With full markings, labels, pocket and stamps, clean text. Minor wear on edges/corners. Automated Inspection and Measurement - Volume 730, Proceedings of SPIE - The International Society for Optical Engineering, 28-30 October 1986, Cambridge, Massachusetts. Size: 4to. Ex-Library. Nº de ref. del artículo: 020080
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