The keynote speech on future trends in flash memories is followed by 16 additional review and research papers. Among the topics are built-in self-testing for detecting of coupling faults in semiconductor memories, a low-power current sensing scheme for CMOS SRAM, scanning capacitance microscopy analysis of DRAM trench capacitors, the thermal monitoring of memories, and a true testprocessor-per-pin algorithmic pattern generator. No subject index. Annotation c. by Book News, Inc., Portland, Or.
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The keynote speech on future trends in flash memories is followed by 16 additional review and research papers. Among the topics are built-in self-testing for detecting of coupling faults in semiconductor memories, a low-power current sensing scheme for CMOS SRAM, scanning capacitance microscopy analysis of DRAM trench capacitors, the thermal monitoring of memories, and a true testprocessor-per-pin algorithmic pattern generator. No subject index. Annotation c. by Book News, Inc., Portland, Or.
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