Sinopsis
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
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Reseña del editor
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
"Sobre este título" puede pertenecer a otra edición de este libro.
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Characterization of Semiconductor Materials, Volume 1 : Principles and Methods
Publicado por
Elsevier Science & Technology Books, 1989
ISBN 10: 0815512007
ISBN 13: 9780815512004
Antiguo o usado
Tapa dura
Librería: Better World Books: West, Reno, NV, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Nº de ref. del artículo: 57585211-75
Comprar usado
EUR 9,20
Gastos de envío gratis
Se envía dentro de Estados Unidos de America
Se envía dentro de Estados Unidos de America
Cantidad disponible: 1 disponibles