Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits: 211 (The Springer International Series in Engineering and Computer Science, 211) - Tapa dura

Michael, Christopher; Ismail, Mohammed

 
9780792392996: Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits: 211 (The Springer International Series in Engineering and Computer Science, 211)
Tapa dura
ISBN 10: 079239299X ISBN 13: 9780792392996
Editorial: Springer, 1993

Sinopsis

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
1993
Idioma
Inglés
ISBN 10 
079239299X
ISBN 13 
9780792392996
Encuadernación
Tapa dura
Número de páginas
212
Contacto del fabricante
no disponible
Persona responsable
CMN Printpool Inh. Mathis Neumann
https://www.also.com/ec/cms5/en_6000/6000/index.jsp

Friedrich-Karl-Str. 9
Hamburg
Alemania

Otras ediciones populares con el mismo título

9781461363798: Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits: 211 (The Springer International Series in Engineering and Computer Science)

Edición Destacada

ISBN 10:  1461363799 ISBN 13:  9781461363798
Editorial: Springer, 2012
Tapa blanda