The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.
"Sinopsis" puede pertenecer a otra edición de este libro.
`I recommend this book for the following audience in the field of digital design: advanced undergraduate and graduate students, who are interested in testing digital systems and are looking for an up-to-date course in design for testability; practising engineers interested in incorporating modern techniques for improving testability into their designs; and design managers who are looking for ways to improve factory profitability and return on investments. The book will appeal especially to practising VLSI and ASIC designers, and I recommend it to them highly.'
Engineering Applications of Artifical Intelligence, 7:1
' In summary, this text is a useful and readable description of the application and use of boundary-scan. It is also a useful addition to previous boundary-scan publication, and complementary to more recent. I thoroughly recommend this book. ' Microprocessors and Microsystems 17:5 1993
The ever-increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimetre, have become available. As a consequence the trace distances between the copper tracks on a printed circuit board cmne down to the same value. Not only the required small physical dimensions of the test nails have made conventional testing unfeasible, but also the complexity to provide test signals for the many hundreds of test nails has grown out of limits. Therefore a new board test methodology had to be invented. Following the evolution in the IC test technology. Boundary-Scan testing hm; become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 3,20 gastos de envío en Estados Unidos de America
Destinos, gastos y plazos de envíoEUR 5,92 gastos de envío en Estados Unidos de America
Destinos, gastos y plazos de envíoLibrería: HPB-Red, Dallas, TX, Estados Unidos de America
Perfect Paperback. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Nº de ref. del artículo: S_375362945
Cantidad disponible: 1 disponibles
Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de America
Hardcover. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 0.85. Nº de ref. del artículo: G0792392965I4N00
Cantidad disponible: 1 disponibles
Librería: Florida Mountain Book Co., Datil, NM, Estados Unidos de America
Condición: Very Good+. Hardcover, [xvi], 225 pages. Very Good+ condition. Second printing. Size 9.5"x6.25". Chapter headings: 1 - PCB Testing; 2 - The Boundary-Scan Test Standard; 3 - Hardware Test Innovations; 4 - BST Design Languages; 5 - PCB Test Strategy Backgrounds; 6 - Management Aspects. Includes Appendix, Glossary, References, and Index. Book has light exterior handling/shelfwear, else Fine condition, clean and unmarked. Nº de ref. del artículo: 009399
Cantidad disponible: 1 disponibles
Librería: Anybook.com, Lincoln, Reino Unido
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792392965. Nº de ref. del artículo: 5834233
Cantidad disponible: 1 disponibles
Librería: Anybook.com, Lincoln, Reino Unido
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780792392965. Nº de ref. del artículo: 5834228
Cantidad disponible: 1 disponibles
Librería: Ammareal, Morangis, Francia
Softcover. Condición: Bon. Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Edition 1993. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slight signs of wear on the cover. Edition 1993. Ammareal gives back up to 15% of this item's net price to charity organizations. Nº de ref. del artículo: D-607-657
Cantidad disponible: 1 disponibles
Librería: NEPO UG, Rüsselsheim am Main, Alemania
Condición: Gut. Auflage: 1993. 244 Seiten ex Library Book aus einer wissenschafltichen Bibliothek Sprache: Englisch Gewicht in Gramm: 545 24,7 x 16,5 x 2,1 cm, Broschiert. Nº de ref. del artículo: 372197
Cantidad disponible: 1 disponibles
Librería: Buchmarie, Darmstadt, Alemania
Condición: Good. Ältere Ausgabe. Auflage: 1993. Nº de ref. del artículo: 3291200_7b4_3x
Cantidad disponible: 1 disponibles
Librería: BennettBooksLtd, San Diego, NV, Estados Unidos de America
perfect. Condición: New. In shrink wrap. Looks like an interesting title! Nº de ref. del artículo: Q-0792392965
Cantidad disponible: 1 disponibles
Librería: Best Price, Torrance, CA, Estados Unidos de America
Condición: New. SUPER FAST SHIPPING. Nº de ref. del artículo: 9780792392965
Cantidad disponible: 2 disponibles