Artículos relacionados a Forces in Scanning Probe Methods: 286 (NATO Science...
Sinopsis
This volume contains the proceedin,r. of the NATO Advanced Study Institute on "Forces in Scanning Probe Methods which was CG-sponsered and organized by the "Forum fUr N anowissenschaften". The conference was held in Schluchsee in the south em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively.
"Sinopsis" puede pertenecer a otra edición de este libro.
Reseña del editor
This volume contains the proceedin,r. of the NATO Advanced Study Institute on "Forces in Scanning Probe Methods which was CG-sponsered and organized by the "Forum fUr N anowissenschaften". The conference was held in Schluchsee in the south em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively.
Reseña del editor
The invention of scanning tunneling microscopy, atomic force microscopy and near field optical microscopy has opened up a new field of research: scanning probe methods (SMP). The quality of image acquisition has made great strides in recent times, but many fundamental, unsolved problems remain unanswered about the interaction between probe tip and sample.
Forces in Scanning Probe Methods contains 60 contributions dedicated to these problems. Most of the contributions are reviews, presenting condensed, relevant information, suitable for both students and specialists. The contributions cover the instrumental aspects and design of force microscopes in different environments (ambient pressure, low temperature, ultrahigh vacuum, liquids). Theory is also covered, including ab initio calculations and molecular dynamics simulations. Mechanical properties at micro and nanoscales receive intensive treatment, including adhesion, friction and wear: the friction phenomenon is one of the most hotly debated questions.
Other highlights include advances in near field optical microscopy and its relation to forces, the application of force microscopy in NMR, and the observance of flux lines in high T c superconductors. Recent advances in biology and chemistry also attract attention.
"Sobre este título" puede pertenecer a otra edición de este libro.
Comprar nuevo
Ver este artículo
EUR 318,34
EUR 4,66 gastos de envío desde Reino Unido a España
Destinos, gastos y plazos de envío
Resultados de la búsqueda para Forces in Scanning Probe Methods: 286 (NATO Science...
Imagen de archivo
Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286)
Librería: AwesomeBooks, Wallingford, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
hardcover. Condición: Very Good. Forces in Scanning Probe Methods: 286 (NATO Science Series E:, 286) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. . Nº de ref. del artículo: 7719-9780792334064
Cantidad disponible: 1 disponibles
Imagen del vendedor
Forces in Scanning Probe Methods. NATO ASI Series/ Series E: Applied Sciences - Vol. 286
Publicado por
Kluwer Academic Publishers, 1995
ISBN 10: 079233406X
ISBN 13: 9780792334064
Antiguo o usado
Tapa dura
Librería: Schürmann und Kiewning GbR, Naumburg, Alemania
Calificación del vendedor: 5 de 5 estrellas
Hardcover/Pappeinband. Condición: Gut. xiii, 644 Seiten Sprache: Englisch Gewicht in Gramm: 1500. Nº de ref. del artículo: 138198
Cantidad disponible: 1 disponibles
Imagen de archivo
Forces in Scanning Probe Methods (NATO Science Series E:, 286)
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. In. Nº de ref. del artículo: ria9780792334064_new
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Forces in Scanning Probe Methods
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Gebunden. Condición: New. Proceedings of the NATO Advanced Study Institute, Schluchsee, Germany, March 7--18, 1994 Preface. Introduction to Scanning Probe Methods. Instrumentation. Theory. Metallic Adhesion. Photons. Friction. Nano and Micromechanics. Magnetic Storage and. Nº de ref. del artículo: 458438673
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Forces in Scanning Probe Methods
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware - This volume contains the proceedin,r. of the NATO Advanced Study Institute on 'Forces in Scanning Probe Methods which was CG-sponsered and organized by the 'Forum fUr N anowissenschaften'. The conference was held in Schluchsee in the south em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively. Nº de ref. del artículo: 9780792334064
Cantidad disponible: 2 disponibles