1999 53rd Conference on Computer-Aided Design and Test for High-Speed Electronics - Tapa blanda

IEEE

 
9780780355002: 1999 53rd Conference on Computer-Aided Design and Test for High-Speed Electronics

Sinopsis

This conference highlights multidisciplinary areas of control system applications enabling us to respond to the technological challenges of the 21st century. Topics covered include: uncertainty, complexity and learning; control in the automotive industry; and convex matrix optimization problems.

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Reseña del editor

This conference highlights multidisciplinary areas of control system applications enabling us to respond to the technological challenges of the 21st century. Topics covered include: uncertainty, complexity and learning; control in the automotive industry; and convex matrix optimization problems.

"Sobre este título" puede pertenecer a otra edición de este libro.