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Sinopsis
This volume is devoted to consideration of the use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. Each chapter treats a type of film used in silicon devices and discusses typical problems seen throughout that film's history, including characterization tools which are most effectively used in clarifying and solving those problems.
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Reseña del editor
This volume is devoted to consideration of the use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. Each chapter treats a type of film used in silicon devices and discusses typical problems seen throughout that film's history, including characterization tools which are most effectively used in clarifying and solving those problems.
"Sobre este título" puede pertenecer a otra edición de este libro.
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Characterization in Silicon Processing
Publicado por
Saint Louis, Missouri, U.S.A.: Butterworth-Heinemann, 1993
ISBN 10: 0750691727
ISBN 13: 9780750691727
Antiguo o usado
Tapa dura
Librería: Rob the Book Man, Vancouver, WA, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Hardcover. Condición: Very Good. Hardback in very good condition. Libary stamp on bottom of pages. Nº de ref. del artículo: 21838
Cantidad disponible: 1 disponibles