This text provides a description of the large range of techniques currently in use for the characterization of the microstructure of materials. The authors explain the interactions between various radiations of materials, and show how these interactions form the basis of specific evaluation and measurement methods. Sections of the book deal with basic science and technology, such as diffraction laws and vacuum techniques. The characterization techniques are divided on the basis of the interrogation radiation source. Computer applications in instrument control, data acquisition and analysis are discussed, together with simulation techniques.
"Sobre este título" puede pertenecer a otra edición de este libro.
EUR 15,32 gastos de envío desde Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envíoLibrería: Anybook.com, Lincoln, Reino Unido
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Dust Jacket in good condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:9780750302036. Nº de ref. del artículo: 9060550
Cantidad disponible: 1 disponibles
Librería: BookOrders, Russell, IA, Estados Unidos de America
Hard Cover. Condición: Good. No Jacket. Usual ex-library features. The interior is clean and tight. Binding and cover are good. The book has been library hardbound. 517 pages. Ex-Library. Nº de ref. del artículo: 120441
Cantidad disponible: 1 disponibles
Librería: Bingo Books 2, Vancouver, WA, Estados Unidos de America
Hardcover. Condición: Near Fine. hardback book in near fine condition. Nº de ref. del artículo: 126341
Cantidad disponible: 1 disponibles