Electron Microscopy and Multiscale Modeling: An International Conference: v. 999 (AIP Conference Proceedings / Materials Physics and Applications) - Tapa dura

 
9780735405196: Electron Microscopy and Multiscale Modeling: An International Conference: v. 999 (AIP Conference Proceedings / Materials Physics and Applications)

Reseña del editor

The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modeling from around the world to explore how to synergistically combine atomic scale characterization and modeling to enhance the development of new materials.

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