Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03: v. 696 (AIP Conference Proceedings) - Tapa dura

 
9780735401686: Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03: v. 696 (AIP Conference Proceedings)
Tapa dura
ISBN 10: 0735401683 ISBN 13: 9780735401686
Editorial: American Institute of Physics, 2003

Sinopsis

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
American Institute of Physics
Año de publicación
2003
Idioma
Inglés
ISBN 10 
0735401683
ISBN 13 
9780735401686
Encuadernación
Tapa dura
Número de páginas
197
Editor
Koenraad Paul M., Kemerink Martijn
Contacto del fabricante
no disponible
Persona responsable
no disponible