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Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03: v. 696 (AIP Conference Proceedings) - Tapa dura
Sinopsis
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
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Reseña del editor
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
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Imagen de archivo
Scanning Tunneling Microscopy/Spectroscopy and Related Techniques [With CDROM]
Publicado por
American Institute of Physics, 2003
ISBN 10: 0735401683
ISBN 13: 9780735401686
Antiguo o usado
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Librería: ThriftBooks-Atlanta, AUSTELL, GA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Very Good. No Jacket. Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.05. Nº de ref. del artículo: G0735401683I4N10
Cantidad disponible: 1 disponibles