Intellectual Property Damages: Guidelines and Analysis - Tapa dura

Glick, Mark A.; Reymann, Lara A.; Hoffman, Richard

 
9780471237198: Intellectual Property Damages: Guidelines and Analysis

Sinopsis

A comprehensive resource for anyone involved in intellectual property litigation

With Intellectual Property Damages you'll get the basics of the intellectual property litigation process, the essential "rules" in postulating damages theories, the basics of IP law, the economic policies that are the foundation for much of IP litigation, the skills necessary to correctly calculate damages in IP cases--and more!

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Acerca del autor

Mark Glick, JD, PhD is a professor of economics at the University of Utah where he teaches industrial organization, antitrust economics and law and economics. He has also taught antitrust law and regulated industries in the College of Law. Glick has over 15 years of experience in law and economics issues and litigation. He has been involved in numerous cases as a consultant, attorney and/or expert involving regulated antitrust, intellectual property damages, and commercial damages.

Lara A. Reymann, JD is an attorney with Parsons Behle Latimer, Salt Lake City UT whose practice focuses on intellectual property litigation. She is a member of the American Bar Association's Intellectual Property Law Section and Litigation Section. She has been a pressnter on the topic of IP damages at several conferences and seminars.

De la contraportada

A comprehensive resource for anyone involved in intellectual property litigation

As the number of cases involving intellectual property (IP) increases, so does the demand for individuals who can create, support, and prove an effective theory of damages in those cases. Intellectual Property Damages presents the basics of intellectual property, the litigation process, the essential "rules" in postulating damages theories, the economic principles that are the foundation for much of IP damages, and the skills necessary to correctly calculate damages in IP cases. Legal professionals and their clients will benefit from the unique combination of knowledge acquired from the author?s experience with law, economics, accounting, and (to a more limited extent) finance in the context of IP damages theories. Intellectual Property Damages contains case summaries, useful forms for discovery, examples of effective expert opinions and testimony, and detailed calculations under various theories of damages. It also incorporates graphs illustrating economic principles, equations that might be used to support (or detract from) a damages theory, and examples of legal documents that commonly appear in IP litigation.

De la solapa interior

A comprehensive resource for anyone involved in intellectual property litigation

As the number of cases involving intellectual property (IP) increases, so does the demand for individuals who can create, support, and prove an effective theory of damages in those cases. Intellectual Property Damages presents the basics of intellectual property, the litigation process, the essential rules in postulating damages theories, the economic principles that are the foundation for much of IP damages, and the skills necessary to correctly calculate damages in IP cases. Legal professionals and their clients will benefit from the unique combination of knowledge acquired from the author's experience with law, economics, accounting, and (to a more limited extent) finance in the context of IP damages theories. Intellectual Property Damages contains case summaries, useful forms for discovery, examples of effective expert opinions and testimony, and detailed calculations under various theories of damages. It also incorporates graphs illustrating economic principles, equations that might be used to support (or detract from) a damages theory, and examples of legal documents that commonly appear in IP litigation.

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Otras ediciones populares con el mismo título

9780471679899: Intellectual Property Damages: Guidelines and Analysis

Edición Destacada

ISBN 10:  0471679895 ISBN 13:  9780471679899
Editorial: John Wiley & Sons Inc, 2004
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