Reliability Technology: Principles and Practice of Failure Prevention in Electronic Systems (Quality and Reliability Engineering Series) - Tapa dura

Acerca del autor

Mr. Norman Pascoe, MIT Consultant (retired), UK
The author has worked for forty three years in the fields of Environmental Testing , Quality and Reliability and Environmental Stress Screening. Since 1996 he has worked as a Reliability Technology consultant to some leading telecommunications and aerospace industries. Before becoming a consultant Norman served for five years as European Product Assurance adviser to Nortel Networks Limited.
Mr Pascoe has presented papers at seminars and conferences in North America, the UK and other European countries. He became a member of the Society of Environmental Engineers in December 1987 and was elected a Fellow of the Society of Environmental Engineers in April 1998.

De la contraportada

This text demonstrates how to achieve failure free equipment performance in electronic systems by studying the essential reliability technology disciplines that contribute to failure free product in design, development and manufacturing. It presents detailed accounts of established "hands-on" procedures for understanding potential failure mechanisms in materials and components, and identifies the many hazards from new product manufacture through end-of-life disposal.

Key features:

• describes how product robustness is proven by non-destructive stress margin analysis
• clearly delineates between accelerated ageing and accelerated life testing, and exposes the myth that all products must be treated as candidates for simultaneous multi-axis, multi-stress environmental forcing functions
• provides details of proven methodologies for the development and implementation of cost effective environmental stress screening programmes covering different levels of product assembly
• summarises other sources of environmental stress and their effect on product performance, robustness and ageing
• covers the physical concepts governing the response of electronic products to steady state temperature extremes, temperature cycling, thermal and mechanical shock, and vibration

With classroom tested material, this book contains mathematical models so readers may gain a thorough understanding of the mechanisms that contribute to the erosion of hardware, functional robustness and durability. Case studies and unique worked examples examine the physical properties of individual electronic hardware designs.

This reference text is for quality and reliability engineers, manufacturing process engineers, environmental test engineers and design engineers in domestic, commercial and military electronics industries. It will also be of interest to advanced electrical and electronic engineering students studying power systems or reliability technology courses, also production, project and procurement managers in telecommunications, automotive and aerospace industries.

De la solapa interior

This text demonstrates how to achieve failure free equipment performance in electronic systems by studying the essential reliability technology disciplines that contribute to failure free product in design, development and manufacturing. It presents detailed accounts of established hands-on procedures for understanding potential failure mechanisms in materials and components, and identifies the many hazards from new product manufacture through end-of-life disposal.

Key features:

• describes how product robustness is proven by non-destructive stress margin analysis
• clearly delineates between accelerated ageing and accelerated life testing, and exposes the myth that all products must be treated as candidates for simultaneous multi-axis, multi-stress environmental forcing functions
• provides details of proven methodologies for the development and implementation of cost effective environmental stress screening programmes covering different levels of product assembly
• summarises other sources of environmental stress and their effect on product performance, robustness and ageing
• covers the physical concepts governing the response of electronic products to steady state temperature extremes, temperature cycling, thermal and mechanical shock, and vibration

With classroom tested material, this book contains mathematical models so readers may gain a thorough understanding of the mechanisms that contribute to the erosion of hardware, functional robustness and durability. Case studies and unique worked examples examine the physical properties of individual electronic hardware designs.

This reference text is for quality and reliability engineers, manufacturing process engineers, environmental test engineers and design engineers in domestic, commercial and military electronics industries. It will also be of interest to advanced electrical and electronic engineering students studying power systems or reliability technology courses, also production, project and procurement managers in telecommunications, automotive and aerospace industries.