Encyclopedia of Statistics in Quality and Reliability - Tapa dura

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Editors-in-Chief

Fabrizio Ruggeri, CNR-IMATI, Milan, ItalyProf. Ruggeri's research interests include reliability, general statistical modelling with applications in industry, and Bayesian statistics. He is a former President of the European Network for Business and Industrial Statistics (ENBIS) and former Board member of the International Society for Bayesian Analysis (ISBA). He edited two volumes on Bayesian Robustness and special issues of journals. He also served as the Editor (1999-2002) of the ISBA Bulletin and is currently Editor-in-Chief of Applied Stochastic Models in Business and Industry and an Editor of Bayesian Analysis. He is Co-Director of the Applied Bayesian Statistics summer school (ABS) and Chair of the Scientific Committee of the Bayesian Inference in Stochastic Processes (BISP) series of workshops. He is a faculty in the Ph.D. programme in Mathematics and Statisics at the University of Pavia and the Master programme in Applied Mathematics for Industry at University of Milano Bicocca. He has been member of many committees, including Savage Award, De Groot Award and Box Medal. He is the author of nearly 100 publications.

Ron S. Kenett, KPA Ltd, Raanana, Israel and University of Turin, Turin, Italy. Professor Kenett’s interests include Strategic Planning and Quality Management, Industrial Statistics and Biostatistics, Statistical Process Control and Design of Experiments, Survey Methodology and Software Quality. He is a Fellow of the Royal Statistical Society, a Senior Member of the American Society for Quality,past member of the board of the Israeli Statistical Association and past president of ENBIS, the European Network for Business and Industrial Statistics. He is editor in chief of the journal Quality Technology and Quantitative Management and associate editor of the Journal of the Royal Statistical Society (A) and Applied Stochastic Models in Business and Industry. He is co author of 4 books and over 130 papers, including Modern Industrial Statistics (with S. Zacks), Duxbury Press 1998, and  Software Process Quality - Management and Control (with E. Baker) Marcel Dekker Inc., 1999. Ron has been a consultant for leading corporations such as AT&T, hp, EDS, SanDisk, IBM and Amdocs. His career has combined academic positions with activity in the industrial and business sector.

Frederick W. Faltin, The Faltin Group, Cody, WY, USAMr. Faltin’s interests include Managing Six Sigma, Design for Six Sigma, Business Process Simulation & Optimization, Financial Quality, Supply Chain Management, and Design of Experiments.  He is a Fellow of the American Statistical Association, a recipient of the Shewell Prize of the American Society for Quality, and has served on the selection committees of various ASQ awards. He served on the Editorial Review Board of the Journal of Quality Technology, is a past Chair of ASA's Quality and Productivity Section, and is a member of the boards of the Quality & Productivity Research Conference and the Fall Technical Conference. Mr. Faltin has published dozens of papers on applications of mathematics & statistics, and has authored Six Sigma curricula for a number of prominent companies, including Motorola―the company that invented Six Sigma. He was formerly manager of the Strategic Enterprise Technologies laboratory at GE’s Global Research Center, and is today Managing Director of The Faltin Group, which he founded in 1999.

Editors

Basics Statistics

Jeroen de Mast, University of Amsterdam,

The Netherlands

Computationally Intensive Methods & Simulation

Simon Wilson, Trinity College Dublin, Ireland

Design of Experiments & Robust Design

David Steinberg, Tel Aviv University, Israel

Health, Safety & Environmental Applications

Tony Greenfield, Greenfield Research, UK

Management of Quality & Business Statistics

Blanton Godfrey, College of Textiles, USA

Ramon Leon, University of Tennessee, USA

Process Capability & Measurement Systems Analysis

Connie Borror, University of Illinois, USA

Process Control

Mike Adams, University of Alabama, USA

Reliability: Life Cycle & Warranty Cost Prediction

Refik Soyer, George Washington University, USA

Reliability: Life Distribution Modeling & Accelerated Testing

Tom Mazzuchi, George Washington University, USA

Sampling

Rainer Göb, University of Wuerzberg, Germany

Statistical and Stochastic Modelling

Shelley Zacks, Binghamton University, USA

System Reliability

Steven Rigdon, Southern Illinois University, USA