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Libro 7 de 90: Springer Series in Reliability Engineering

Salicone, Simona

 
9780387306551: Measurement Uncertainty: An Approach via the Mathematical Theory of Evidence (Springer Series in Reliability Engineering)

Sinopsis

The expression of uncertainty in measurement poses a challenge since it involves physical, mathematical, and philosophical issues. This problem is intensified by the limitations of the probabilistic approach used by the current standard (the GUM Instrumentation Standard). This text presents an alternative approach. It makes full use of the mathematical theory of evidence to express the uncertainty in measurements. Coverage provides an overview of the current standard, then pinpoints and constructively resolves its limitations. Numerous examples throughout help explain the book’s unique approach.

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De la contraportada

The expression of uncertainty in measurement is a challenging aspect for researchers and engineers working in instrumentation and measurement because it involves physical, mathematical and philosophical issues. This problem is intensified by the limitations of the probabilistic approach used by the current standard (GUM).

This text is the first to make full use of the mathematical theory of evidence to express the uncertainty in measurements. It gives an overview of the current standard, then pinpoints and constructively resolves its limitations through its unique approach. The text presents various tools for evaluating uncertainty, beginning with the probabilistic approach and concluding with the expression of uncertainty using random-fuzzy variables. The exposition is driven by numerous examples. The book is designed for immediate use and application in research and laboratory work.

Prerequisites for students include courses in statistics and measurement science. Apart from a classroom setting, this book can be used by practitioners in a variety of fields (including applied mathematics, applied probability, electrical and computer engineering, and experimental physics), and by such institutions as the IEEE, ISA, and National Institute of Standards and Technology.

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