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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering) - Tapa blanda

Libro 77 de 98: Optical Science and Engineering
 
9780367402945: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
Tapa blanda
ISBN 10: 0367402947 ISBN 13: 9780367402945
Editorial: Taylor & Francis Ltd, 2019

Sinopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

"Sinopsis" puede pertenecer a otra edición de este libro.

Acerca del autor

Lawrence E. Murr

De la contraportada

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Taylor & Francis Ltd
Año de publicación
2019
Idioma
Inglés
ISBN 10 
0367402947
ISBN 13 
9780367402945
Encuadernación
Tapa blanda
Número de edición
2
Número de páginas
856
Editor
Murr Lawrence E
Contacto del fabricante
Taylor and Francis, GPSR Taylor and Francis
gpsr@taylorandfrancis.com

Taylor & Francis Verlag GmbH, Kaufingerstraße 24
München
80331
Alemania