Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1968 (Classic Reprint) - Tapa blanda

Sinopsis

Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1968

Through long contact with the semiconductor industry, the Electronic Technology Division of the National Bureau of Standards has gathered substantial evidence of the need for improved measurement methods and standards for semiconductor materials characterization, for process con trol, and for device characterization. These methods and standards are needed for satisfactory buyer-seller exchanges, for economy in govern ment purchasing, and for improved product uniformity, interchangeability, and reliability. The need is recognized both by industry and by govern ment. Nbs as a national center for measurement development, without vendor or user bias, and already competent in the field, has repeatedly been singled out as the uniquely appropriate organization to provide assistance in the resolution of these problems.

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