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Statistical Regression with Measurement Error: No. 6 (Kendall's Library of Statistics) - Tapa dura

Ness, John W.Van; Cheng, Chi-Lun

 
9780340614617: Statistical Regression with Measurement Error: No. 6 (Kendall's Library of Statistics)
Tapa dura
ISBN 10: 0340614617 ISBN 13: 9780340614617
Editorial: Hodder Arnold, 1999

Sinopsis

Covering the field of statistics called measurement error models, this work includes a full discussion of functional and structural models as well as the more general ultrastructural model. The material is presented at a level appropriate for beginning graduate students and includes problems at the end of each chapter to aid learning. Computational methods are considered, and the rationale is to provide an intermediate level survey of the field of measurement error models without too much mathematical detail. Topics covered include: model identifiability; parameter estimation; confidence intervals; asymptotic theory; finite sample properties; orthogonal regression; modified lease squares methods; instrumental variable methods; the linear and non-linear Berkson Model; calibration; and computational methods.

"Sinopsis" puede pertenecer a otra edición de este libro.

De la contraportada

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Hodder Arnold
Año de publicación
1999
Idioma
Inglés
ISBN 10 
0340614617
ISBN 13 
9780340614617
Encuadernación
Tapa dura
Número de páginas
256
Contacto del fabricante
no disponible
Persona responsable
no disponible