Surface Infrared and Raman Spectroscopy: Methods and Applications: 3 (Methods of Surface Characterization) - Tapa dura

Suëtaka, W.

 
9780306449635: Surface Infrared and Raman Spectroscopy: Methods and Applications: 3 (Methods of Surface Characterization)
Tapa dura
ISBN 10: 0306449633 ISBN 13: 9780306449635
Editorial: Springer, 1995

Sinopsis

are intended to fill the gap between a manufacturer’s handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur­ faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di­ verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.

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Reseña del editor

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur­ faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di­ verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.

Reseña del editor

Written with engineers and researchers in mind, author W. Suëtka offers a well-illustrated, basic reference on the use of infrared (IR) and Raman spectroscopy in the investigation of surfaces of practical materials. This book only requires a basic knowledge of vibrational spectroscopy for understanding the included discussions. Chapters illustrate applications of IR and Raman spectroscopy in the investigation of a variety of real surfaces. Featured in this volume are the typical results obtained for species on clean and well-defined surfaces in ultrahigh vacuum environments.

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Editorial
Springer
Año de publicación
1995
Idioma
Inglés
ISBN 10 
0306449633
ISBN 13 
9780306449635
Encuadernación
Tapa dura
Número de páginas
288
Contacto del fabricante
no disponible
Persona responsable
CMN Printpool Inh. Mathis Neumann
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Friedrich-Karl-Str. 9
Hamburg
Alemania

Otras ediciones populares con el mismo título

9781489909442: Surface Infrared and Raman Spectroscopy: Methods and Applications: 3 (Methods of Surface Characterization)

Edición Destacada

ISBN 10:  1489909443 ISBN 13:  9781489909442
Editorial: Springer, 2013
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