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Sinopsis
This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant.
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Reseña del editor
This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant.
"Sobre este título" puede pertenecer a otra edición de este libro.
- EditorialPlenum Publishing Corporation
- Año de publicación1981
- ISBN 10 0306406543
- ISBN 13 9780306406546
- EncuadernaciónTapa dura
- IdiomaInglés
- Número de páginas283
- Contacto del fabricanteno disponible
EUR 30,39
EUR 20,78 gastos de envío desde Estados Unidos de America a España
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Exafs Spectroscopy: Techniques and Applications
Librería: Zubal-Books, Since 1961, Cleveland, OH, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Condición: Fine. *Price HAS BEEN REDUCED by 10% until Monday, June 16 (SALE ITEM)* 275 pp., hardcover, hand stamps to the front endpapers, else fine in a very good dust jacket. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Nº de ref. del artículo: ZB1187963
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