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Advances in X-Ray Analysis: Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6–8, 1969: Volume 13 - Tapa dura

 
9780306381133: Advances in X-Ray Analysis: Proceedings of the Eighteenth Annual Conference on Applications of X-Ray Analysis Held August 6–8, 1969: Volume 13

Sinopsis

This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers in the application of low energy x-ray and the associated photo-Auger electron interactions. These include A. K. Baird and W. L. Baun on Light Element Analysis and Long Wavelength Instrumentation; J. E. Hollid~, D. W. Fischer, R. J. Liefeld and D. J. Nagel on Bonding and Valence State; H. Friedman and W. P. Reidy on X-R~ Astronomy; and R. Nordberg on Photo-Auger Electron Spectroscopy. Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy. It has been most appropriate and indeed a privilege to have Dr. Herbert Friedman as a speaker and contributor to this volume.

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Reseña del editor

This conference has attempted to achieve a balance in the presentation of papers on the application of current methods to established problem areas and on the introduction of new methods and applications. It has recognized the relevance of papers on basic physics and chemistry and on the total interaction of x-r~s with matter. In order to achieve sufficient depth, a topic is chosen each year for special emphasis. This conference had as its central theme, "The Interactions and Applications of Low Energy X-R~s." Those who were invited as speakers and as contributors to this volume are among the outstanding workers in the application of low energy x-ray and the associated photo-Auger electron interactions. These include A. K. Baird and W. L. Baun on Light Element Analysis and Long Wavelength Instrumentation; J. E. Hollid~, D. W. Fischer, R. J. Liefeld and D. J. Nagel on Bonding and Valence State; H. Friedman and W. P. Reidy on X-R~ Astronomy; and R. Nordberg on Photo-Auger Electron Spectroscopy. Upon reading over the papers as presented here, one cannot help but be impressed by the steady, dynamic growth and expansion of the field of applied x-ray analysis, beginning about thirty years ago with quantitative elementary analysis and extending to the present time with dramatic and exciting applications to x-r~ astronomy. It has been most appropriate and indeed a privilege to have Dr. Herbert Friedman as a speaker and contributor to this volume.

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Burton L. Henke, ed.
Publicado por Plenum, 1970
ISBN 10: 0306381133 ISBN 13: 9780306381133
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Librería: Zubal-Books, Since 1961, Cleveland, OH, Estados Unidos de America

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Condición: Good. *Price HAS BEEN REDUCED by 10% until Monday, Sept. 29 (weekend ale item)* 681 pp., Hardcover, ex library, else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Nº de ref. del artículo: ZB888320

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Barrett, Charles S. (editor)
Publicado por Plenum Press, New York, 1970
ISBN 10: 0306381133 ISBN 13: 9780306381133
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Librería: P.C. Schmidt, Bookseller, Kettering, OH, Estados Unidos de America

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Hard Cover. Condición: Very Good. First Edition. Volume 13; Proceedings of the 18th annual conference on applications of X-Ray analysis held august 5-7, 1969; a very good hardcover; an ex-library copy with usual markings; internally pages bright and clean; ---------- SATISFACTION GUARANTEED --------- FAST, COURTEOUS SERVICE ------ ALL ORDERS SHIPPED WITH DELIVERY CONFIRMATION; Size: 6 x 9". Ex-Library. Nº de ref. del artículo: K6L1

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