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Secondary Ion Mass Spectrometry: Principles and Applications: 17 (International Series of Monographs on Chemistry) - Tapa dura
Sinopsis
Secondary ion mass spectrometry is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. This book attempts to provide an overview of the phenomenology, technology and application of this method as a technique for materials analysis. The text explains the basic physical and chemical principles and introduces theories which have been developed to explain the process. It also covers emergent techniques such as sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. The author outlines the practical benefits and pitfalls which may arise and features many practical examples to illustrate the application of secondary ion mass spectrometry to real problems.
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Secondary ion mass spectrometry is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. This book attempts to provide an overview of the phenomenology, technology and application of this method as a technique for materials analysis. The text explains the basic physical and chemical principles and introduces theories which have been developed to explain the process. It also covers emergent techniques such as sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. The author outlines the practical benefits and pitfalls which may arise and features many practical examples to illustrate the application of secondary ion mass spectrometry to real problems.
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Secondary Ion Mass Spectrometry: Principles and Applications
Publicado por
Clarendon Press, 1989
ISBN 10: 019855625X
ISBN 13: 9780198556251
Antiguo o usado
Tapa dura
Librería: Ammareal, Morangis, Francia
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Bon. Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Salissures sur la tranche. Edition 1989. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slight signs of wear on the cover. Stains on the edge. Edition 1989. Ammareal gives back up to 15% of this item's net price to charity organizations. Nº de ref. del artículo: D-460-359
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Secondary ion mass spectrometry : priciples and applications.
Publicado por
Oxford University Press, 1990
ISBN 10: 019855625X
ISBN 13: 9780198556251
Antiguo o usado
Tapa dura
Librería: Kloof Booksellers & Scientia Verlag, Amsterdam, Holanda
Calificación del vendedor: 4 de 5 estrellas
Condición: very good. Oxford : Clarendon Press, 1989. Orig. cloth binding. xii,341 pp. (The international series of monographs on chemistry, 17). Library stamps. Condition : very good copy. ISBN 9780198556251. Keywords : , Nº de ref. del artículo: 269606
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