78631-9 The comprehensive guide to analog and mixed-signal IC testing. Increasingly, ICs contain both analog and digital circuitry, making the testing process extremely challenging. This comprehensive guide reviews all the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It outlines the state-of-the-art in analog testing, and covers both major alternatives in-depth: specification-based test and fault model-based test. *Includes contributions from leading researchers worldwide *Provides comprehensive references for further research *Fault modeling, fault simulation and test generation techniques *Extensive coverage of design-for-test techniques *Best methods for spectral-based built-in self test Understand which digital testing techniques and algorithms are applicable to analog and mixed-signal circuitry, and which must be modified. Review fault modeling in detail, especially inductive fault analysis. Learn how to implement the 1194.4 Standard Mixed-Signal Test Bus, understanding its test functions, capabilities, potential benefits and costs.Finally, take a careful look at the testing and design issues associated with CMOS switched-current circuits. Analog and Mixed-Signal Test is the essential tutorial and reference for all electrical engineers designing or testing circuits and devices with analog components.
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The most comprehensive guide to analog and mixed-signal IC testing.-- Extensive coverage of practical circuits.-- Pros and cons of each potential test solution.-- Written and edited by recognized leaders in the field.More and more chips are being designed with both analog and digital circuitry next to each other, which makes testing analog circuitry even more challenging. This comprehensive guide reviews all the potential testing options, helping designers, engineers, CAD developers and researchers choose the most cost-effective, accurate solutions for both mixed-signal and analog-only testing.The book begins by outlining current research in analog test, and discussing both major alternatives: specification-based test and fault model based test. Next, it reviews fault modeling in detail, notably inductive fault analysis. The book includes a tutorial survey of current fault simulation and test generation techniques for analog and mixed-signal circuits. Other equally detailed coverage includes: design for test techniques; spectral-based built-in self test methods; the new board-level analog test standard; and testing switched-current circuits.
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Librería: HPB-Red, Dallas, TX, Estados Unidos de America
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