Hardcover. Condici�n: Bon. Ancien livre de biblioth�que. Traces de pliures sur la couverture. Traces d'usure sur la couverture. Couverture diff�rente. Edition 1987. Ammareal reverse jusqu'� 15% du prix net de cet article � des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Traces of creases on the cover. Signs of wear on the cover. Different cover. Edition 1987. Ammareal gives back up to 15% of this item's net price to charity organizations. N� de ref. del art�culo: E-065-919

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Developments in Integrated Circuit Testing

Miller, D.M., ed.

Publicado por London: Academic Press, 1987

ISBN 10: 0124967353 ISBN 13: 9780124967359

Antiguo o usado Tapa dura

Librería: Zubal-Books, Since 1961, Cleveland, OH, Estados Unidos de America

Calificaci�n del vendedor: 5 de 5 estrellas

Condici�n: Good. *Price HAS BEEN REDUCED by 10% until Monday, June 16 (weekend SALE item)* 440 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. N� de ref. del art�culo: ZB615902

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