Advanced Topics in Forensic DNA Typing: Methodology

John M. Butler is a NIST Fellow and Special Assistant to the Director for Forensic Science, Office of Special Programs, at the U.S. National Institute of Standards and Technology, in Gaithersburg, Maryland. Dr. Butler earned his PhD from the University of Virginia while doing DNA research in the FBI Laboratory's Forensic Science Research Unit. He has won numerous scientific awards, including being named Science Watch’s #1 world-wide high-impact author in legal medicine and forensic science over the last decade (July 2011). He has over 150 publications in this field and is a frequent presenter on the topic of DNA typing, and has authored four other DNA Typing books including Advanced Topics in Forensic DNA Typing: Methodology. For a detailed CV, visit http://www.cstl.nist.gov/strbase/butler.htm.

"John Butler has produced a series of books detailing the major issues involved in forensic DNA typing. His latest book on advanced topics in DNA typing provides exceptional coverage of this complex and difficult topic. Through his work at NIST and his many collaborations with forensic analysts, Dr. Butler has kept up to date with all recent advances in the field. In his book he brings remarkable clarity through examples, diagrams, and case notes that is unsurpassed in any other text on the subject."-- Bruce McCord, Professor, Department of Chemistry and Biochemistry, Florida International University, Miami, Florida

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