Basics of Interferometry - Tapa dura

Hariharan, P.

 
9780123252180: Basics of Interferometry
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ISBN 10: 0123252180 ISBN 13: 9780123252180
Editorial: Elsevier, 1991

Sinopsis

This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers. The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.

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Acerca del autor

Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA’s Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE’s Dennis Gabor Award and, most recently, SPIE’s highest award, the Gold Medal.

De la contraportada

This is an introductory to the use of interferometic techniques for precision measurements in science and engineering; it is intended for those who have some knowledge of optics but little or no previous experience in interferometry. Accordingly, the presentation has been specifically designed to make it easy for readers to find and assimilate the material they need. Math is held to a minimum, and capsule summaries at the beginning and end of each chapter provide an overview of the topics explained in more detail in the text. Each chapter also contains a set of worked problems that give a feel for numbers.

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Editorial
Elsevier
Año de publicación
1991
Idioma
Inglés
ISBN 10 
0123252180
ISBN 13 
9780123252180
Encuadernación
Tapa dura
Número de páginas
232
Contacto del fabricante
no disponible
Persona responsable
Yeepin GmbH
492000000000
sunshine12232@outlook.com

Alleestr.11
Kaiserslautern
Rheinland-Pfalz
67655
Alemania

Otras ediciones populares con el mismo título

9780124120716: Basics of Interferometry

Edición Destacada

ISBN 10:  0124120717 ISBN 13:  9780124120716
Editorial: Academic Press, 2016
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