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Sinopsis
This book is for those who have some knowledge of optics, but little or no previous experience in interferometry. Accordingly, the carefully designed presentation helps readers easily find and assimilate the interferometric techniques they need for precision measurements. Mathematics is held to a minimum, and the topics covered are also summarized in capsule overviews at the beginning and end of each chapter. Each chapter also contains a set of worked problems that give a feel for numbers. The first five chapters present a clear tutorial review of fundamentals. Chapters six and seven discuss the types of lasers and photodetectors used in interferometry. The next eight chapters describe key applications of interferometry: measurements of length, optical testing, studies of refractive index fields, interference microscopy, holographic and speckle interferometry, interferometric sensors, interference spectroscopy, and Fourier-transform spectroscopy. The final chapter offers suggestions on choosing and setting up an interferometer.
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Acerca del autor
Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA’s Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE’s Dennis Gabor Award and, most recently, SPIE’s highest award, the Gold Medal.
De la contraportada
This is an introductory to the use of interferometic techniques for precision measurements in science and engineering; it is intended for those who have some knowledge of optics but little or no previous experience in interferometry. Accordingly, the presentation has been specifically designed to make it easy for readers to find and assimilate the material they need. Math is held to a minimum, and capsule summaries at the beginning and end of each chapter provide an overview of the topics explained in more detail in the text. Each chapter also contains a set of worked problems that give a feel for numbers.
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Basics of Interferometry
Publicado por
Academic Press, 1991
ISBN 10: 0123252180
ISBN 13: 9780123252180
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Basics of Interferometry
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Academic Press, Inc., Boston, 1992
ISBN 10: 0123252180
ISBN 13: 9780123252180
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Librería: Good Books In The Woods, Spring, TX, Estados Unidos de America
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Hardcover. Condición: Very Good. First Edition; First Printing. Pictorial boards. "This is an introduction to the use of interferometric techniques for precision measurements in science and engineering; it is intended for those who have some knowledge of optics but little or no previous experience in interferometry." Ships same or next business day. Sticker residue on front free endpaper. Slight slant to spine. Minor edge wear. Foxing on head edge. Very thin scratches on front board. Pages are clean and tight. No dust jacket. ; Charts & Graphs; Large 8vo 9" - 10" tall; 213 pages. Nº de ref. del artículo: 79507
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Basics of Interferometry
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Academic Press, 1991
ISBN 10: 0123252180
ISBN 13: 9780123252180
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Librería: Mispah books, Redhill, SURRE, Reino Unido
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Basics of Interferometry,
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Academic Press, 1992
ISBN 10: 0123252180
ISBN 13: 9780123252180
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Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Dust jacket in good condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,550grams, ISBN:9780123252180. Nº de ref. del artículo: 9882580
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