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Speckle Metrology / Quantum Electronics Principles and Applications
Publicado por
Academic Press, Inc., a subsidiary of Harcourt, Btace, Jovanovich, Publishers, New York - San Francisco - London, 1978
ISBN 10: 0122413601
ISBN 13: 9780122413605
Antiguo o usado
Tapa dura
Original o primera edición
Librería: Cat's Curiosities, Pahrump, NV, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: As New. Estado de la sobrecubierta: Near Fine. 1st Edition. One of a series of monographs edited by Yoh-Han Pao and Paul Kelley. Numerous contributors including A. Luxmoore of the University College of Swansea and A. Tiziani of Wild Heerbrugg Ltd., Heerbrugg, Switzerland. Mr. Erf was of the United Technologies Research Center, East Hartford, Conn. Surface Roughness Measurement; Displacement and Strain Measurement; Vibration Analysis and Deformation Measurement; Electronic Speckle Pattern Interferometry; Topological Speckle and Structures Inspection; Measurement of Crystal Length Changes; Measurement of Displacement Around Crack Tips, etc. On a nice coated stock, well illustrated with diagrams and B&W plates. 331 pp. including index. Reduced from $45. Nº de ref. del artículo: 003010
Cantidad disponible: 1 disponibles
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SPECKLE METROLOGY (QUANTUM ELECTRONICS - PRINCIPLES AND APPLICATIONS)
Publicado por
Academic Press, NEW YORK, 1978
ISBN 10: 0122413601
ISBN 13: 9780122413605
Antiguo o usado
Tapa dura
Librería: The Sensible Magpie, Creswell, OR, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Hardcover. Designed as a self-contained reference work, the book sets down basic concepts and properties to develop theory and techniques for solving practical measurement problems in industry, "including such areas as surface roughness evaluation, displacement and strain movement, and vibration and deformation analysis." 331 pp. Some light soiling to board surfaces, previous owner's name blacked out to top and bottom edges and FFEP, DJ has very tiniest bit of edgewear and some light creasing to front flap and very light soiling to panel surfaces. Book has gilt lettering to front board and spine, is tight, bright, and clean. Very Good Plus / Very Good Plus. Nº de ref. del artículo: 225
Cantidad disponible: 1 disponibles
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Speckle Metrology
Publicado por
Academic Press, New York, 1978
ISBN 10: 0122413601
ISBN 13: 9780122413605
Antiguo o usado
Tapa dura
Librería: Book Booth, Berea, OH, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Hardcover. Condición: Good. Ex-library with usual markings. Covers have minor wear and chipping. Binding tight. xiv + 331 pages including index. Analysis of speckle or surface roughness and its effect on laser holography. Black and white figures. Size: 6.25 x 9.25. Nº de ref. del artículo: 039740
Cantidad disponible: 1 disponibles