Semiconductor Measurements and Instrumentation

4,75 valoración promedio
( 4 valoraciones por GoodReads )
 
9780070576971: Semiconductor Measurements and Instrumentation

With semiconductor fab construction booming, a vast and growing audience awaits this updated edition of a classic reference. It incorporates all the new approaches and tools for semiconductor material characterization that have been developed to accommodate increasingly smaller semiconductor geometries. Advanced techniques are clearly spelled out for evaluating crystal defects, impurity concentration, lifetime, film thickness, resistivity, and other important electrical properties such as mobility, hall effect, and conductivity type. Highly accurate ways of measuring hardness, stress, and various kinds of surface contamination are included.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor:

This is the definitive reference on semiconductor characterization tools! Here, in one well-organized volume, are detailed explanations of the advanced and "traditional" techniques for evaluating virtually every criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type. Reliable, high-accuracy methods of measuring hardness, stress, and various kinds of surface contamination are also included.In addition to its value as a practical everyday reference, the text also serves as an excellent user's guide to the latest methods of optical microscopy, scanning electron microscopy (SEM), electron microprobe analysis, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), scanning probe microscopy (SPM), and secondary ion mass spectrometry (SIMS). This is the only guide that offers such "dual coverage" of its topic - in terms of both measurements and tools.

Contraportada:

The definitive reference on semiconductor characterization tools! Semiconductor Measurements & Instrumentation, Second Edition. This fully updated edition of the classic reference incorporates all the new approaches and tools for semiconductor material characterization that have been developed to accomodate ever-shrinking semiconductor geometries. Here, in one well-organized volume, are detialed explanations of the advanced techniques for evaluating virtually every criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type. Reliable, high-accuracy methods of measuring hardness, stress, and various kinds of surface contamination are also included. In addition to its value as a practical everyday reference, the text also serves as an excellent user's guide to the latest methods of optical microscopy, scanning electron microscopy (SEM), electron microprobe analysis, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), scanning probe microscopy (SPM), and secondary ion mass spectrometry (SIMS). As the only guide that offers such "dual coverage" of its topic--in terms of both measurements and tools--and this timely and thorough reference is sure to be of considerable ongoing benefit to solid state and semiconductor engineers.

"Sobre este título" puede pertenecer a otra edición de este libro.

Los mejores resultados en AbeBooks

1.

W. R. Runyan, T. J. Shaffner
Editorial: McGraw-Hill Professional (1998)
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Cantidad: 1
Librería
Better World Books: West
(Reno, NV, Estados Unidos de America)
Valoración
[?]

Descripción McGraw-Hill Professional, 1998. Estado de conservación: Good. 2nd Edition. N/A. Ships from Reno, NV. Shows some signs of wear, and may have some markings on the inside. Nº de ref. de la librería GRP85677577

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 149,21
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
A Estados Unidos de America
Destinos, gastos y plazos de envío

2.

W. R. Runyan, T. J. Shaffner
Editorial: McGraw-Hill Professional (1998)
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Cantidad: 2
Librería
Better World Books
(Mishawaka, IN, Estados Unidos de America)
Valoración
[?]

Descripción McGraw-Hill Professional, 1998. Estado de conservación: Very Good. 2nd Edition. N/A. Former Library book. Great condition for a used book! Minimal wear. Nº de ref. de la librería GRP92926649

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 149,21
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
A Estados Unidos de America
Destinos, gastos y plazos de envío

3.

Shaffner, T. J., Runyan, W. R.
Editorial: McGraw-Hill Professional (1998)
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Tapa dura Cantidad: 1
Librería
HPB-Dallas
(Dallas, TX, Estados Unidos de America)
Valoración
[?]

Descripción McGraw-Hill Professional, 1998. Hardcover. Estado de conservación: Acceptable. pencil writing inside front cover Item is intact, but may show shelf wear. Pages may include notes and highlighting. May or may not include supplemental or companion material. Access codes may or may not work. Connecting readers since 1972. Customer service is our top priority. Nº de ref. de la librería mon0001090397

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 145,83
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,70
A Estados Unidos de America
Destinos, gastos y plazos de envío

4.

W. R. Runyan, T. J. Shaffner
Editorial: McGraw-Hill Professional (1998)
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Cantidad: 3
Librería
Better World Books Ltd
(Dunfermline, Reino Unido)
Valoración
[?]

Descripción McGraw-Hill Professional, 1998. Estado de conservación: Very Good. 2nd Edition. N/A. Ships from the UK. Former Library book. Great condition for a used book! Minimal wear. Nº de ref. de la librería GRP91310475

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 216,75
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,46
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

5.

W. R. Runyan, T. J. Shaffner
Editorial: McGraw-Hill Professional
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Cantidad: 1
Librería
Phatpocket Limited
(Waltham Abbey, HERTS, Reino Unido)
Valoración
[?]

Descripción McGraw-Hill Professional. Estado de conservación: Good. Ex-library, so some stamps and wear, but in good overall condition. Nº de ref. de la librería Z1-T-005-00826

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 217,99
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 6,95
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

6.

W. R. Runyan
Editorial: McGraw-Hill Professional (1998)
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Tapa dura Cantidad: 1
Librería
Anybook Ltd.
(Lincoln, Reino Unido)
Valoración
[?]

Descripción McGraw-Hill Professional, 1998. Estado de conservación: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. , 950grams, ISBN:9780070576971. Nº de ref. de la librería 6429658

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 242,83
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 7,08
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

7.

W. R. Runyan
Editorial: McGraw-Hill Professional 1998-02-01 (1998)
ISBN 10: 0070576971 ISBN 13: 9780070576971
Usado Tapa dura Cantidad: 1
Librería
Lost Books
(AUSTIN, TX, Estados Unidos de America)
Valoración
[?]

Descripción McGraw-Hill Professional 1998-02-01, 1998. Hardcover. Estado de conservación: good. 2. 0070576971. Nº de ref. de la librería 512310

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar usado
EUR 256,20
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,70
A Estados Unidos de America
Destinos, gastos y plazos de envío