Artículos relacionados a Electron Microscopy in Mineralogy

Electron Microscopy in Mineralogy ISBN 13: 9783642661983

Electron Microscopy in Mineralogy - Tapa blanda

 
9783642661983: Electron Microscopy in Mineralogy
Ver todas las copias de esta edición ISBN.
 
 
Reseña del editor:
During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists­ having solved most of the structural and crystallographic problems in metals­ have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man­ chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.

"Sobre este título" puede pertenecer a otra edición de este libro.

  • EditorialSpringer-Verlag
  • Año de publicación1976
  • ISBN 10 364266198X
  • ISBN 13 9783642661983
  • EncuadernaciónTapa blanda
  • Número de páginas584
  • EditorWenk H.-R.

Comprar nuevo

Ver este artículo

Gastos de envío: GRATIS
A Estados Unidos de America

Destinos, gastos y plazos de envío

Añadir al carrito

Otras ediciones populares con el mismo título

9783540073710: Electron Microscopy in Mineralogy

Edición Destacada

ISBN 10:  354007371X ISBN 13:  9783540073710
Editorial: Springer, 1976
Tapa dura

  • 9780387073712: Electron microscopy in mineralogy

    Spring...
    Tapa dura

Los mejores resultados en AbeBooks

Imagen del vendedor

Publicado por Springer (2011)
ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Soft Cover Cantidad disponible: 1
Librería:
booksXpress
(Bayonne, NJ, Estados Unidos de America)

Descripción Soft Cover. Condición: new. Nº de ref. del artículo: 9783642661983

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 103,89
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
A Estados Unidos de America
Destinos, gastos y plazos de envío
Imagen de archivo

Publicado por Springer (2011)
ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Tapa blanda Cantidad disponible: > 20
Librería:
Lucky's Textbooks
(Dallas, TX, Estados Unidos de America)

Descripción Condición: New. Nº de ref. del artículo: ABLIING23Mar3113020233520

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 112,41
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,72
A Estados Unidos de America
Destinos, gastos y plazos de envío
Imagen de archivo

P.E. Champness
Publicado por Springer (2011)
ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Tapa blanda Cantidad disponible: > 20
Impresión bajo demanda
Librería:
Ria Christie Collections
(Uxbridge, Reino Unido)

Descripción Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Nº de ref. del artículo: ria9783642661983_lsuk

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 116,24
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 11,70
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío
Imagen del vendedor

ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Taschenbuch Cantidad disponible: 2
Impresión bajo demanda
Librería:
BuchWeltWeit Ludwig Meier e.K.
(Bergisch Gladbach, Alemania)

Descripción Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book. 584 pp. Englisch. Nº de ref. del artículo: 9783642661983

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 106,99
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 23,00
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Imagen del vendedor

Wenk, H.-R.|Champness, P. E.|Christie, J. M.|Cowley, J. M.|Heuer, A. H.|Thomas, G.|Tighe, N. J.
Publicado por Springer Berlin Heidelberg (2011)
ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Tapa blanda Cantidad disponible: > 20
Librería:
moluna
(Greven, Alemania)

Descripción Condición: New. Nº de ref. del artículo: 5067487

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 92,27
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 48,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Imagen del vendedor

Publicado por Springer Berlin Heidelberg (2011)
ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Taschenbuch Cantidad disponible: 1
Librería:
AHA-BUCH GmbH
(Einbeck, Alemania)

Descripción Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book. Nº de ref. del artículo: 9783642661983

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 111,86
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 32,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío
Imagen de archivo

Wenk, H.-R. (Editor) / Champness, P.E. (Co-editor) / Christie, J.M. (Co-editor) / Heuer, A.H. (Co-editor) / Cowley, J.M. (Co-editor) / Thomas, G. (Co-editor) / Tighe, N.J. (Co-editor)
Publicado por Springer-Verlag (2011)
ISBN 10: 364266198X ISBN 13: 9783642661983
Nuevo Paperback Cantidad disponible: 2
Librería:
Revaluation Books
(Exeter, Reino Unido)

Descripción Paperback. Condición: Brand New. reprint edition. 584 pages. 9.40x6.70x1.40 inches. In Stock. Nº de ref. del artículo: x-364266198X

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 142,55
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 11,72
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío