Diffusion in solids at moderate temperatures is a well-known phenomenon. However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.
Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy.
The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method.
"Sobre este título" puede pertenecer a otra edición de este libro.
Gastos de envío:
EUR 45,00
De Alemania a Estados Unidos de America
Gastos de envío:
GRATIS
A Estados Unidos de America
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Hardcover. Condición: new. Nº de ref. del artículo: 9783642241208
Cantidad disponible: 10 disponibles
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Condición: New. Nº de ref. del artículo: ABLIING23Mar3113020221515
Cantidad disponible: Más de 20 disponibles
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Condición: New. Nº de ref. del artículo: 13856020-n
Cantidad disponible: 5 disponibles
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Nº de ref. del artículo: ria9783642241208_lsuk
Cantidad disponible: Más de 20 disponibles
Librería: Revaluation Books, Exeter, Reino Unido
Hardcover. Condición: Brand New. 2012 edition. 110 pages. 9.25x6.25x0.50 inches. In Stock. Nº de ref. del artículo: x-3642241204
Cantidad disponible: 2 disponibles
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Diffusion in solids at moderate temperatures is a well-known phenomenon. However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy. The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method. 108 pp. Englisch. Nº de ref. del artículo: 9783642241208
Cantidad disponible: 2 disponibles
Librería: GreatBookPricesUK, Castle Donington, DERBY, Reino Unido
Condición: New. Nº de ref. del artículo: 13856020-n
Cantidad disponible: 5 disponibles
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Condición: New. This book discusses the application of X-ray Photon Correlation Spectroscopy (XPCS) to study diffusion in solids at moderate temperatures, proposing systems selected for high diffuse intensity, and establishing theoretical models for interpretating results. Series: Springer Theses. Num Pages: 108 pages, biography. BIC Classification: PHFC; PNFC; PNFS. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 13. Weight in Grams: 333. . 2012. 2012. Hardback. . . . . Nº de ref. del artículo: V9783642241208
Cantidad disponible: 15 disponibles
Librería: Buchpark, Trebbin, Alemania
Condición: Sehr gut. Zustand: Sehr gut - Buchschnitt verkürzt - gepflegter, sauberer Zustand | Seiten: 108 | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 11242970/12
Cantidad disponible: 1 disponibles
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Diffusion in solids at moderate temperatures is a well-known phenomenon. However, direct experimental evidence about the responsible atomic-scale mechanisms has been scarce, due to difficulties in probing the relevant length- and time-scales. The present thesis deals with the application of X-ray Photon Correlation Spectroscopy (XPCS) for answering such questions. This is an established method for the study of slow dynamics on length-scales of a few nanometres. The scattered intensity in the diffuse regime, i.e. corresponding to atomic distances, is very low, however, and so it has so far been considered impossible to use XPCS for this problem.Threefold progress is reported in this work: It proposes a number of systems selected for high diffuse intensity, it optimizes the photon detection and data evaluation procedures, and it establishes theoretical models for interpretating the results. Together these advances allowed the first successful atomic-scale XPCS experiment, which elucidated the role of preferred configurations for atomic jumps in a copper-gold alloy. The growth in available coherent X-ray intensity together with next-generation X-ray sources will open up a wide field of application for this new method. Nº de ref. del artículo: 9783642241208
Cantidad disponible: 1 disponibles