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Reseña del editor:
This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring.
Biografía del autor:
Manpreet Singh received his Doctorate degree from Sant Longowal Institute of Engineering and Technology, Longowal (Deemed University) in 2013. His research interests are Vibration Analysis and Fault diagnosis in rotational machinery and he has good number of publications in the area of his interest.
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- EditorialLAP LAMBERT Academic Publishing
- Año de publicación2017
- ISBN 10 3330087269
- ISBN 13 9783330087262
- EncuadernaciónTapa blanda
- Número de páginas168
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Measurement of seeded defect width in the bearing using Sym5 wavelet
Publicado por
LAP LAMBERT Academic Publishing Mai 2017
(2017)
ISBN 10: 3330087269
ISBN 13: 9783330087262
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Descripción Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring. 168 pp. Englisch. Nº de ref. del artículo: 9783330087262
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Measurement of seeded defect width in the bearing using Sym5 wavelet
Publicado por
LAP LAMBERT Academic Publishing
(2017)
ISBN 10: 3330087269
ISBN 13: 9783330087262
Nuevo
Taschenbuch
Cantidad disponible: 1
Librería:
Valoración
Descripción Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring. Nº de ref. del artículo: 9783330087262
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Measurement of seeded defect width in the bearing using Sym5 wavelet
Publicado por
LAP LAMBERT Academic Publishing
(2017)
ISBN 10: 3330087269
ISBN 13: 9783330087262
Nuevo
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Descripción Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Singh ManpreetManpreet Singh received his Doctorate degree from Sant Longowal Institute of Engineering and Technology, Longowal (Deemed University) in 2013. His research interests are Vibration Analysis and Fault diagnosis in rotatio. Nº de ref. del artículo: 151237341
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Measurement of seeded defect width in the bearing using Sym5 wavelet
Publicado por
LAP LAMBERT Academic Publishing
(2017)
ISBN 10: 3330087269
ISBN 13: 9783330087262
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Descripción Paperback. Condición: Brand New. 168 pages. 8.66x5.91x0.38 inches. In Stock. Nº de ref. del artículo: zk3330087269
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