Artículos relacionados a Stress and Strain in Epitaxy: Theoretical Concepts,...

Stress and Strain in Epitaxy: Theoretical Concepts, Measurements and Applications - Tapa blanda

 
9780444508652: Stress and Strain in Epitaxy: Theoretical Concepts, Measurements and Applications
Ver todas las copias de esta edición ISBN.
 
 
Reseña del editor:
This book contains keynote lectures which have been delivered at the 3rd Porquerolles' School on Surface Science, SIR2000 (Surfaces-Interfaces-Relaxation). The aim of this school was to review the main concepts necessary to understand the role of interfacial stress, strain and relaxation in crystal growth by heteroepitaxy. By bringing together scientists from various fields (physics, chemistry, materials science and engineering) which daily use complementary methodological approaches (experiment, theory, modelization), the school allowed to offer 11 multidisciplinary courses. This book addresses the state of art of stress in epitaxial materials, it describes the various methods to measure the atomic displacement and stress fields, it reviews the spectroscopic methods necessary to map the interface chemistry, it details the theoretical methods and concepts which are needed to predict them and it questions the fact that stress and relaxation can induce specific properties in magnetism, catalysis, electron transport and so on.The field of stress and strain in heteroepitaxy has know large developments during the last ten years. New techniques have been used to set up new devices in which functionalities are obtained through structuration at a nanometer scale. Large-scale integration and reduced dimensions are the key factors to optimize the achievements of these devices. Already used in industry (quantum wells, magnetic sensors), these devices are obtained by molecular beam epitaxy, sputtering or pulsed laser deposition. Their reduced dimensionality increased the number of surfaces and interfaces, the role of which has to be precised. Experimentalists try now to associate materialshaving very different crystal structure and chemical composition. The elastic stress stored in the device can induce various phenomena which have to be evaluated, understood and predicted. The book intends also to show that many questions are still in debate.

"Sobre este título" puede pertenecer a otra edición de este libro.

  • EditorialElsevier Science
  • Año de publicación2001
  • ISBN 10 0444508651
  • ISBN 13 9780444508652
  • EncuadernaciónTapa blanda
  • Número de páginas332
  • EditorDeville Jean-Paul

Comprar nuevo

Ver este artículo

Gastos de envío: EUR 11,66
De Reino Unido a Estados Unidos de America

Destinos, gastos y plazos de envío

Añadir al carrito

Los mejores resultados en AbeBooks

Imagen de archivo

Jean-Paul Deville
Publicado por Elsevier Science Ltd (2001)
ISBN 10: 0444508651 ISBN 13: 9780444508652
Nuevo Paperback Cantidad disponible: 1
Librería:
Revaluation Books
(Exeter, Reino Unido)

Descripción Paperback. Condición: Brand New. 322 pages. 9.25x6.50x0.75 inches. In Stock. Nº de ref. del artículo: zk0444508651

Más información sobre este vendedor | Contactar al vendedor

Comprar nuevo
EUR 212,50
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 11,66
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío