"Sinopsis" puede pertenecer a otra edición de este libro.
"Sobre este título" puede pertenecer a otra edición de este libro.
Gastos de envío:
EUR 11,69
De Reino Unido a Estados Unidos de America
Descripción Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Nº de ref. del artículo: ria9780195092042_lsuk
Descripción HRD. Condición: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L1-9780195092042
Descripción HRD. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L1-9780195092042
Descripción Condición: New. New. In shrink wrap. Looks like an interesting title! 1.64. Nº de ref. del artículo: Q-019509204X
Descripción Hardcover. Condición: new. Hardcover. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning ForceMicroscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation,and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Nº de ref. del artículo: 9780195092042
Descripción Condición: New. Nº de ref. del artículo: ABLIING23Feb2215580031846
Descripción Condición: New. Buy with confidence! Book is in new, never-used condition. Nº de ref. del artículo: bk019509204Xxvz189zvxnew
Descripción Condición: New. New! This book is in the same immaculate condition as when it was published. Nº de ref. del artículo: 353-019509204X-new
Descripción Hardcover. Condición: new. Hardcover. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning ForceMicroscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation,and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9780195092042