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Approaches for Hardware Fault Mitigation in Multicore Processors: Resilient systems with unreliable devices - Tapa blanda

 
9783846554630: Approaches for Hardware Fault Mitigation in Multicore Processors: Resilient systems with unreliable devices
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Reseña del editor:
This thesis addresses one of the fundamental challenges emerging in microprocessor design, namely hardware reliability and resilience. Since inception in the 70's, microprocessors have primarily benefited from technological advancements in semiconductors fabrication allowing for an exponential increase in computing capability of chips by shrinking transistors sizes. Unfortunately, forecasts indicate that further shrinking in size will be accompanied by variability in transistor performance and reliability. This thesis proposes novel designs and enhancements to provide hardware reliability for parallel workloads. In particular, it is provided noteworthy improvements in Redundant Multi Threading (RMT) fault-tolerant approaches, as well as novel Expected Miss Ratio (EMR) model to determine the impact of hard faults on cache memories.
Biografía del autor:
Daniel Sánchez received his Ms and PhD degrees from the Universidad de Murcia (Spain) in 2007 and 2011, respectively. In 2011, he joined the Intel-UPC Barcelona Research Center as a research scientist. His mainresearch interests include processor microarchitecture, hardware reliability and other topics in the area of resiliency.

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  • EditorialLAP Lambert Acad. Publ.
  • Año de publicación2011
  • ISBN 10 3846554634
  • ISBN 13 9783846554630
  • EncuadernaciónTapa blanda
  • Número de páginas192

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Descripción Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This thesis addresses one of the fundamental challenges emerging in microprocessor design, namely hardware reliability and resilience. Since inception in the 70's, microprocessors have primarily benefited from technological advancements in semiconductors fabrication allowing for an exponential increase in computing capability of chips by shrinking transistors sizes. Unfortunately, forecasts indicate that further shrinking in size will be accompanied by variability in transistor performance and reliability. This thesis proposes novel designs and enhancements to provide hardware reliability for parallel workloads. In particular, it is provided noteworthy improvements in Redundant Multi Threading (RMT) fault-tolerant approaches, as well as novel Expected Miss Ratio (EMR) model to determine the impact of hard faults on cache memories. 192 pp. Englisch. Nº de ref. del artículo: 9783846554630

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Descripción Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This thesis addresses one of the fundamental challenges emerging in microprocessor design, namely hardware reliability and resilience. Since inception in the 70's, microprocessors have primarily benefited from technological advancements in semiconductors fabrication allowing for an exponential increase in computing capability of chips by shrinking transistors sizes. Unfortunately, forecasts indicate that further shrinking in size will be accompanied by variability in transistor performance and reliability. This thesis proposes novel designs and enhancements to provide hardware reliability for parallel workloads. In particular, it is provided noteworthy improvements in Redundant Multi Threading (RMT) fault-tolerant approaches, as well as novel Expected Miss Ratio (EMR) model to determine the impact of hard faults on cache memories. Nº de ref. del artículo: 9783846554630

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