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Descripción Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Nº de ref. del artículo: ria9781489989529_lsuk
Descripción Soft Cover. Condición: new. Nº de ref. del artículo: 9781489989529
Descripción PF. Condición: New. Nº de ref. del artículo: 6666-IUK-9781489989529
Descripción Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. 232 pp. Englisch. Nº de ref. del artículo: 9781489989529
Descripción Condición: New. Nº de ref. del artículo: ABLIING23Mar2716030159286
Descripción Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and. Nº de ref. del artículo: 11466848
Descripción Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Nº de ref. del artículo: C9781489989529
Descripción Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. Nº de ref. del artículo: 9781489989529