Publicado por Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Idioma: Inglés
Librería: Bingo Used Books, Vancouver, WA, Estados Unidos de America
EUR 4,49
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Añadir al carritoHardcover. Condición: Very Good. Hardcover in very good + condition.
Publicado por Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,., 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Idioma: Inglés
Librería: Virginia Martin, aka bookwitch, Concord, CA, Estados Unidos de America
EUR 12,58
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Añadir al carritoCondición: Very Good. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in digital system design and testing is discussed. (as per 1985). Book.
EUR 3,38
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Añadir al carritoCondición: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.
EUR 4,28
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Añadir al carritoCondición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:047161307X.
Publicado por Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1986
ISBN 10: 0471603651 ISBN 13: 9780471603658
Idioma: Inglés
Librería: Bingo Used Books, Vancouver, WA, Estados Unidos de America
EUR 13,68
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Añadir al carritoHardcover. Condición: Very Good. hardcover in very good + condition.
EUR 16,41
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Añadir al carritoHardcover. Condición: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
EUR 23,26
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Añadir al carritoCondición: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
EUR 23,26
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Añadir al carritoCondición: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
Publicado por Harper & Row, New York, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Librería: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, Estados Unidos de America
Original o primera edición
EUR 31,91
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Añadir al carritoHardcover. Condición: Fine. First edition. Near fine. Spine darkened just a little.
Publicado por Longman Higher Education, 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Idioma: Inglés
Librería: Ammareal, Morangis, Francia
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: Moyen. Ancien livre de bibliothèque. Traces d'usure sur la couverture. Edition 1986. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Acceptable. Former library book. Signs of wear on the cover. Edition 1986. Ammareal gives back up to 15% of this item's net price to charity organizations.
EUR 98,26
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Añadir al carritoHardcover. Condición: Acceptable. Acceptable. book.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 193,98
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Añadir al carritoCondición: New.
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
EUR 192,76
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Añadir al carritoCondición: New.
EUR 185,56
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Añadir al carritoHRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
EUR 185,51
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Añadir al carritoCondición: New.
EUR 197,75
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Añadir al carritoCondición: New. In.
Publicado por John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Idioma: Inglés
Librería: Grand Eagle Retail, Fairfield, OH, Estados Unidos de America
EUR 229,39
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Añadir al carritoHardcover. Condición: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Publicado por John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Idioma: Inglés
Librería: CitiRetail, Stevenage, Reino Unido
EUR 185,52
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Añadir al carritoHardcover. Condición: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
EUR 288,31
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Añadir al carritoHardcover. Condición: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
Publicado por John Wiley and Sons Ltd, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Idioma: Inglés
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 305,43
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Añadir al carritoCondición: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
EUR 364,62
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Añadir al carritoCondición: As New. Unread book in perfect condition.
EUR 354,94
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Añadir al carritoHardcover. Condición: Like New. Like New. book.
Publicado por John Wiley and Sons Ltd, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Idioma: Inglés
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
EUR 383,53
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Añadir al carritoCondición: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 393,46
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: Revaluation Books, Exeter, Reino Unido
EUR 267,10
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Añadir al carritoHardcover. Condición: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.