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Publicado por Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, 1900
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
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Añadir al carritoHRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
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Añadir al carritoHardcover. 310 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. w11024 9783642166341 Sprache: Englisch Gewicht in Gramm: 550.
Publicado por Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, 1900
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
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Publicado por Springer Berlin Heidelberg, 2011
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
Librería: moluna, Greven, Alemania
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Añadir al carritoCondición: New. Tutorial-like scientific monograph on X-ray diffraction analysisSummarizes the complete knowledge on X-Ray diffraction crystallography and structure analysis of crystals for researchers and graduate studentsPresents the crystallographic bas.
Librería: California Books, Miami, FL, Estados Unidos de America
EUR 261,41
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Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2011
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 246,09
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained.To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 90 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Publicado por Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2011
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
Librería: Rarewaves.com UK, London, Reino Unido
EUR 264,60
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Añadir al carritoHardback. Condición: New. X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Publicado por Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2011
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
Librería: Rarewaves.com USA, London, LONDO, Reino Unido
EUR 279,39
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Añadir al carritoHardback. Condición: New. X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2011, 2011
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 246,09
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Añadir al carritoBuch. Condición: Neu. Neuware -X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 324 pp. Englisch.
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
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Librería: Revaluation Books, Exeter, Reino Unido
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Añadir al carritoHardcover. Condición: Brand New. 321 pages. 9.25x6.25x0.75 inches. In Stock.
Librería: GreatBookPricesUK, Woodford Green, Reino Unido
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Añadir al carritoCondición: As New. Unread book in perfect condition.
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Añadir al carritoHardcover. Condición: Like New. Like New. book.
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Añadir al carritoCondición: Usado - bueno.
Librería: Revaluation Books, Exeter, Reino Unido
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Añadir al carritoHardcover. Condición: Brand New. 321 pages. 9.25x6.25x0.75 inches. In Stock. This item is printed on demand.
Publicado por Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2011, 2011
ISBN 10: 3642166342 ISBN 13: 9783642166341
Idioma: Inglés
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 246,09
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Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained.To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 90 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements. 324 pp. Englisch.