Librería: Books Puddle, New York, NY, Estados Unidos de America
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Añadir al carritoCondición: New. pp. 212.
Librería: Majestic Books, Hounslow, Reino Unido
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Añadir al carritoCondición: New. pp. 212 Illus.
Librería: Biblios, Frankfurt am main, HESSE, Alemania
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Añadir al carritoCondición: New. pp. 212.
Librería: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Alemania
Original o primera edición
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Añadir al carritoFirst Edition. 18 x 25 cm. 208 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Librería: Basi6 International, Irving, TX, Estados Unidos de America
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Añadir al carritoCondición: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Librería: Romtrade Corp., STERLING HEIGHTS, MI, Estados Unidos de America
EUR 100,38
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Añadir al carritoCondición: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
EUR 101,60
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Librería: Ria Christie Collections, Uxbridge, Reino Unido
EUR 111,16
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Añadir al carritoCondición: New. In.
Idioma: Inglés
Publicado por Kluwer Academic Publishers, 2002
ISBN 10: 1402072058 ISBN 13: 9781402072055
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 136,51
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Añadir al carritoCondición: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in various aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . .
Idioma: Inglés
Publicado por Kluwer Academic Publishers, 2002
ISBN 10: 1402072058 ISBN 13: 9781402072055
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
EUR 166,62
Cantidad disponible: 15 disponibles
Añadir al carritoCondición: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in various aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . . Books ship from the US and Ireland.
Idioma: Inglés
Publicado por Springer US, Springer New York, 2002
ISBN 10: 1402072058 ISBN 13: 9781402072055
Librería: AHA-BUCH GmbH, Einbeck, Alemania
EUR 114,36
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Añadir al carritoBuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Librería: Mispah books, Redhill, SURRE, Reino Unido
EUR 169,74
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Añadir al carritoHardcover. Condición: Like New. Like New. book.
Librería: moluna, Greven, Alemania
EUR 92,27
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Añadir al carritoGebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufactu.
Librería: preigu, Osnabrück, Alemania
EUR 95,70
Cantidad disponible: 5 disponibles
Añadir al carritoBuch. Condición: Neu. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation | Krishnendu Chakrabarty | Buch | Einband - fest (Hardcover) | Englisch | 2002 | Springer US | EAN 9781402072055 | Verantwortliche Person für die EU: Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu Print on Demand.
Idioma: Inglés
Publicado por Springer US, Springer US Sep 2002, 2002
ISBN 10: 1402072058 ISBN 13: 9781402072055
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
EUR 106,99
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Añadir al carritoBuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity.SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing.SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing. 212 pp. Englisch.
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
EUR 160,49
Cantidad disponible: 2 disponibles
Añadir al carritoBuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing. 212 pp. Englisch.