Librería: Goodwill Books, Hillsboro, OR, Estados Unidos de America
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Añadir al carritoCondición: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.
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EUR 184,84
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Idioma: Inglés
Publicado por John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Librería: Grand Eagle Retail, Bensenville, IL, Estados Unidos de America
EUR 187,14
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Añadir al carritoHardcover. Condición: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
EUR 183,74
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EUR 77,14
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Añadir al carritoCondición: Gut. Zustand: Gut | Seiten: 692 | Sprache: Englisch | Produktart: Bücher | Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
EUR 180,29
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Añadir al carritoHRD. Condición: New. New Book. Shipped from UK. Established seller since 2000.
EUR 180,28
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EUR 186,79
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Añadir al carritoCondición: New. In.
Idioma: Inglés
Publicado por John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Librería: CitiRetail, Stevenage, Reino Unido
EUR 204,30
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Añadir al carritoHardcover. Condición: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
EUR 236,22
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Añadir al carritoCondición: New. pp. xxii + 668 Illus.
Idioma: Inglés
Publicado por John Wiley and Sons Ltd, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Librería: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 243,00
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Añadir al carritoCondición: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
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Añadir al carritoGebunden. Condición: New. Your road map for meeting today s digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliabilit.
Librería: Books Puddle, New York, NY, Estados Unidos de America
EUR 260,50
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Añadir al carritoCondición: New. pp. xxii + 668 Index 2nd Edition.
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Añadir al carritoHardcover. Condición: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
Idioma: Inglés
Publicado por John Wiley and Sons Ltd, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
EUR 298,04
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Añadir al carritoCondición: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
EUR 255,99
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Añadir al carritoBuch. Condición: Neu. Neuware - Your road map for meeting today s digital testing challengesToday, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, 'the work required to . . . test a chip of this size approached the amount of effort required to design it.' A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approachUp-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Idioma: Inglés
Publicado por John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Librería: AussieBookSeller, Truganina, VIC, Australia
EUR 316,12
Cantidad disponible: 1 disponibles
Añadir al carritoHardcover. Condición: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
EUR 347,04
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Añadir al carritoHardcover. Condición: Like New. Like New. book.
EUR 356,51
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Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
EUR 384,76
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Añadir al carritoCondición: As New. Unread book in perfect condition.
Librería: Revaluation Books, Exeter, Reino Unido
EUR 261,15
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Añadir al carritoHardcover. Condición: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.