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Publicado por Wiley & Sons, Incorporated, John, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Librería: Better World Books: West, Reno, NV, Estados Unidos de America
Libro Original o primera edición
Condición: Good. 1st Edition. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
Publicado por Wiley & Sons, Incorporated, John, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Librería: Better World Books, Mishawaka, IN, Estados Unidos de America
Libro Original o primera edición
Condición: Good. 1st Edition. Used book that is in clean, average condition without any missing pages.
Publicado por Wiley-Interscience, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Librería: HPB-Red, Dallas, TX, Estados Unidos de America
Libro
Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
Publicado por Hoboken, New Jersey, U.S.A.: Wiley-Interscience, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Librería: Bingo Books 2, Vancouver, WA, Estados Unidos de America
Libro
Hardcover. Condición: Near Fine. hardback book in near fine condition.
Publicado por Kluwer Academic Publishers, Norwell, Massachusetts, U.S.A., 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Librería: PsychoBabel & Skoob Books, Didcot, Oxfordshire, OXON, Reino Unido
Libro Original o primera edición
hardcover. Condición: Very Good. Estado de la sobrecubierta: No Dust Jacket. Reprint. Reprinted from a Special Issue of Journal of Electronic Testing Theory and Applications, Vol. 10, Nos. 1 & 2, April 1997. Hardcover with slightly softened tail of spine and slightly bumped top corners and contents in very good clean condition. Previous owner's name on FEP. Profusely illustrated by diagrams and tables. No dust jacket. T. Used.
Publicado por Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro Impresión bajo demanda
Soft Cover. Condición: new. This item is printed on demand.
Publicado por Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer 2015-08, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: Chiron Media, Wallingford, Reino Unido
Libro
PF. Condición: New.
Publicado por Springer International Publishing Aug 2015, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefully reviewed and selected from 28 submissions. CRIWG has been focused on collaboration technology design, development, and evaluation. The background research is influenced by a number of disciplines, such as computer science, management science, informationsystems, engineering, psychology, cognitive sciences, and social sciences. 264 pp. Englisch.
Publicado por Springer-Verlag New York Inc, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: Revaluation Books, Exeter, Reino Unido
Libro
Paperback. Condición: Brand New. 264 pages. 9.25x6.10x0.60 inches. In Stock.
Publicado por Wiley-Interscience, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Librería: BennettBooksLtd, North Las Vegas, NV, Estados Unidos de America
Libro
Condición: New. New. In shrink wrap. Looks like an interesting title! 1.65.
Publicado por Springer International Publishing, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Libro
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefully reviewed and selected from 28 submissions. CRIWG has been focused on collaboration technology design, development, and evaluation. The background research is influenced by a number of disciplines, such as computer science, management science, informationsystems, engineering, psychology, cognitive sciences, and social sciences.
Publicado por Springer International Publishing, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefull.
Publicado por Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro Impresión bajo demanda
Soft Cover. Condición: new. This item is printed on demand.
Publicado por Springer, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro Impresión bajo demanda
Hardcover. Condición: new. This item is printed on demand.
Publicado por Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro
Hardcover. Condición: new.
Publicado por Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: ALLBOOKS1, Salisbury Plain, SA, Australia
Libro
Publicado por Springer, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Librería: Ria Christie Collections, Uxbridge, Reino Unido
Libro Impresión bajo demanda
Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer US Dez 2010, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 164 pp. Englisch.
Publicado por Springer US Okt 2012, 2012
ISBN 10: 1461377986ISBN 13: 9781461377986
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch.
Publicado por Springer US Mai 1997, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch.
Publicado por Springer International Publishing AG, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Librería: Kennys Bookstore, Olney, MD, Estados Unidos de America
Libro
Condición: New. Editor(s): Baloian, Nelson; Zorian, Yervant; Taslakian, Perouz; Shoukouryan, Samvel. Series: Lecture Notes in Computer Science. Num Pages: 261 pages, 74 black & white illustrations, biography. BIC Classification: JNV; UBJ; UMZ; UNH; UYZG. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 409. . 2015. Paperback. . . . . Books ship from the US and Ireland.
Publicado por Springer US, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design.