parag lala (64 resultados)

Condición: Como nuevo. : Este libro trata sobre las técnicas de diseño de autocomprobación y enfatiza las principales técnicas para la tolerancia a fallos de hardware. Los estudiantes de posgrado en cursos de diseño VLSI, así como los diseñadores en ejercicio, apreciarán este tratamiento equilibrado de los conceptos y la teoría subyacentes a la tolerancia a fallos junto con las técnicas prácticas utilizadas para crear sistemas tolerantes a fallos. Introduce la teoría de la fiabilidad y la importancia del mantenimiento, presenta la codificación y la construcción de varios códigos de detección y corrección de errores, analiza en profundidad las técnicas disponibles para el diseño a prueba de fallos de circuitos combinacionales, detalla las técnicas de diseño de comprobadores para detectar bits erróneos y codificar la salida de circuitos de autocomprobación y demuestra cómo diseñar circuitos secuenciales de autocomprobación, incluida una técnica para el diseño de máquinas de estados a prueba de fallos. EAN: 9780124343702 Tipo: Libros Categoría: Tecnología Título: Self-Checking and Fault-Tolerant Digital Design Autor: Parag K. Lala Editorial: Morgan Kaufmann Publishers Inc. Idioma: en Páginas: 232 Formato: tapa dura.

Softcover. Condición: Très bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Couverture différente. Edition 1985. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisat ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Different cover. Edition 1985. Ammareal gives back up to 15% of this item's net price to charity organizations.

Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,600grams, ISBN:9780132150880.

Hardcover. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.95.

Condición: Gut. Zustand: Gut | Seiten: 176 | Sprache: Englisch | Produktart: Bücher.

Soft cover. Condición: New. Contents 1. Basic concepts of reliability. 2. Faults in digital circuits. 3. Test generation. 4. Fault tolerant design of digital systems. 5. Self checking and fail safe logic. 6. Design for testability. 7. Conclusion. Appendix Markov Models. Reference. Annotated bibliography. Index. Fault Tolerance and Testability have the common objective of improving the reliability of computer hardware. This book has been written for the students of Electrical Engineering and Computer Sciences. Chapter 1 deals with the basics of reliability theory chapter 2 covers most of the important faults chapter 3 about fault detection chapter 4 discusses many classes of hardware fault tolerance techniques chapter 5 presents recent developments chapter 6 focuses on various design techniques and chapter 7 highlights the current research issues. The entire text is prepared in lucid language with sufficient basic techniques and examples for easy understanding. Features A systematic study of the various fault tolerant architectures in use. An in depth review of the basic characteristics of self checking logic detailed descriptions of all the major hardware techniques that may be used in fault tolerant and testable design. Comparisons of the various possible techniques for dealing with a problem and assessment of their suitability in various situations. Sections on the fault tolerant design of VLSI chips and state of the art problems still being researched over 200 line drawings and tables. Extensive references at the end of each chapter to facilitate further reading on specialist topics. An annotated bibliography listing textbooks journal articles and conference proceedings on the subject. 264 pp.

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References.

Condición: Gut. Zustand: Gut | Seiten: 199 | Sprache: Englisch | Produktart: Bücher.

Hardcover. Condición: Very Good. VG+ showing minimal wear.

Soft Cover. Condición: Good. Ex-library with the usual features. Library label on front cover. The interior is clean and tight. Binding is good. Cover shows light wear. Ex-Library.

Paperback. Condición: Like New. Like New. book.

Condición: New. In.

N.A. Condición: New. ISBN:9780124343702.