azlarov (16 resultados)

Hardcover. Condición: Near Fine. 1st Edition. hardback book in near fine condition.

Condición: New.

24 cm. original hardcover, isbn 540963162. 136 pp. bibliography. references. index. -(libr label, library stamps, otherwise good). 380g.

Condición: New. In.

Condición: New. pp. 150.

Condición: New. Editor(s): Olkin, Ingram. Translator(s): Stein, M. Num Pages: 137 pages, biography. BIC Classification: PBT. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 8. Weight in Grams: 235. . 2011. Softcover reprint of the original 1st ed. 1986. Paperback. . . . .

Paperback. Condición: Brand New. reprint edition. 142 pages. 9.25x6.10x0.47 inches. In Stock.

Condición: New. Editor(s): Olkin, Ingram. Translator(s): Stein, M. Num Pages: 137 pages, biography. BIC Classification: PBT. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 8. Weight in Grams: 235. . 2011. Softcover reprint of the original 1st ed. 1986. Paperback. . . . . Books ship from the US and Ireland.

Condición: New.

Condición: very good. Berlin & New York: Springer-Verlag, 1986. Hardbound. 137 pp. Index. Condition : fine. Condition : very good copy. ISBN 9783540963165. Keywords : ,

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution.

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution. 148 pp. Englisch.

Condición: New. Print on Demand pp. 150 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Condición: New. PRINT ON DEMAND pp. 150.

Taschenbuch. Condición: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 148 pp. Englisch.

Taschenbuch. Condición: Neu. Characterization Problems Associated with the Exponential Distribution | T. A. Azlarov (u. a.) | Taschenbuch | v | Englisch | 2011 | Springer New York | EAN 9781461293743 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.