T�tulo: Long-Term Reliability of Nanometer VLSI Systems: Modeling, Analysis and Optimization
Editor: Springer
Fecha de publicaci�n: 2020
Idioma: Ingl�s
ISBN 10: 3030261743
ISBN 13: 9783030261740
Encuadernaci�n: Encuadernaci�n de tapa blanda
Estado: New

Acerca de

Sinopsis

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques.

Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models;
Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects;
Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels;
Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

Acerca del autor

Sheldon Tan is a Professor in the Department of Electrical and Computer Engineering, University of California, Riverside, CA. He also is a cooperative faculty member in the Department of Computer Science and Engineering at UCR. He received Ph.D. degree in electrical and computer engineering from the University of Iowa, Iowa City, in 1999. His research interests include VLSI reliability modeling, optimization and management at circuit and system levels, hardware security, thermal modeling, optimization and dynamic thermal management for many-core processors, parallel computing and adiabatic and Ising computing based on GPU and multicore systems. He has published more 290 technical papers and has co-authored 6 books on those areas. Dr. Tan received NSF CAREER Award in 2004. He also received three Best Paper Awards from ASICON’17, ICCD'07, DAC’09. He also received the Honorable Mention Best Paper Award from SMACD’18. He was a Visiting Professorof Kyoto University as a JSPS Fellow from Dec. 2017 to Jan. 2018. He is now serving as Editor in Chief for Elsevier’s Integration, the VLSI Journal, the Associate Editor for three journals: IEEE Transaction on VLSI Systems (TVLSI), ACM Transaction on Design Automation of Electronic Systems (TODAE) and Elsevier’s Microelectronics Reliability.

Mehdi Tahoori is a full professor and Chair of Dependable Nano-Computing (CDNC) at the Institute of Computer Science & Engineering (ITEC), Department of Computer Science, Karlsruhe Institute of Technology (KIT), Germany. He received his PhD and M.S. degrees in Electrical Engineering from Stanford University in 2003 and 2002, respectively, and a B.S. in Computer Engineering from Sharif University of Technology in Iran, in 2000. In 2003, he joined the Electrical and Computer Engineering Department at the Northeastern University as an assistant professor where he promoted to the rank of associate professor with tenure in 2009. From August to December 2015, he was a visiting professor at VLSI Design and Education Center (VDEC), University of Tokyo, Japan. From 2002 to 2003, he was a Research Scientist with Fujitsu Laboratories of America, Sunnyvale, CA, in the area of advanced computer-aided research, engaged in reliability issues in deep-submicrometer mixed-signal very large-scale integration (VLSI) designs. He holds several pending and granted U.S. and international patents. He has authored over 250 publications in major journals and conference proceedings on a wide range of topics, from dependable computing and emerging nanotechnologies to system biology. His current research interests include nanocomputing, reliable computing, VLSI testing, reconfigurable computing, emerging nanotechnologies, and systems biology. Prof. Tahoori was a recipient of the National Science Foundation Early Faculty Development (CAREER) Award. He has been a program committee member, organizing committee member, track and topic chair, as well as workshop, panel, and special session organizer of various conferences and symposia in the areas of VLSI design automation, testing, reliability, and emerging nanotechnologies, such as ITC, VTS, DAC, ICCAD, DATE, ETS, ICCD, ASP-DAC, GLSVLSI, and VLSI Design. He is currently an associate editor for IEEE Design and Test Magazine (D&T), coordinating editor for Springer Journal of Electronic Testing (JETTA), associate editor of VLSI Integration Journal, and associate editor of IET Computers and Digital Techniques.

He was an associate editor of ACM Journal of Emerging Technologies for Computing. He received a number of best paper nominations and awards at various conferences and journals, including ICCAD 2015 and TODAES 2017. He is the Chair of the ACM SIGDA Technical Committee on Test and Reliability.

Taeyoung Kim has received his B.S. degree in electronics engineering from Konkuk University,Seoul, Korea in 2005, the M.S. degree in electrical engineering from University of Virginia, Charlottesville, VA, USA in 2012, and the Ph.D. degree in computer science from University of California, Riverside, CA, USA in 2017. He is currently a senior-level software engineer at Intel Corporation, in Hillsboro, Oregon. Also, he is currently an associate editor for Integration, the VLSI Journal.

Shengcheng Wang has received his B.S. degree in microelectronics from Nankai University, Tianjin, China in 2007, the M.S. degree in microelectronics from Peking University, Beijing, China in 2010, and the Ph.D. degree in computer science from Karlsruhe Institute of Technology, Karlsruhe, Germany in 2018. He is currently a research scientist at Agency for Science, Technology and Research (A*STAR) Institute of Microelectronics (IME), Singapore.

Zeyu Sun has received his B.S. degree in Electronic and Computer Engineering at Hong Kong University of Science and Technology (HKUST) in 2015. He is currently a Ph.D. student in the Department of Electrical and Computer Engineering at the University of California, Riverside.

"Sobre este t�tulo" puede pertenecer a otra edici�n de este libro.

Descripci�n de la librer�a

Quality books, speedy shipping, and great customer service! Please note that used items may not include access codes or cards, CD's or other accessories, regardless of what is stated in item title. If you need to guarantee that these items are included, please purchase a brand new copy.

Ver la p�gina web de la librer�a

Informaci�n empresarial del vendedor

J2B Holdings, LLC
13770 NOEL RD, #803600, Dallas, TX, 75240, U.S.A.

Condiciones de venta y env�o

Condiciones de venta

We guarantee the condition of every book as it's described on the AbeBooks web
sites. Please note that used items may not include access codes or cards, CD's
or other accessories, regardless of what is stated in item title. If you need to
guarantee that these items are included, please purchase a brand new copy.

All requests for refunds and/or returns will be processed in accordance with
AbeBooks policies. If you're dissatisfied with your purchase (Incorrect Book/Not
as Described/Damaged) or if ...

M�s informaci�n

Derecho a cancelaci�n

Si eres un consumidor puedes cancelar el presente contrato de acuerdo con lo indicado a continuaci�n. Son consumidores las personas f�sicas que act�en con un prop�sito ajeno a su actividad comercial, empresarial, oficio o profesi�n.

Documento de informaci�n al consumidor y usuario sobre el desistimiento

Derecho de desistimiento:

Tienes derecho a desistir del presente contrato en un plazo de 14 d�as naturales sin necesidad de justificaci�n.

El plazo de desistimiento expirar� a los 14 d�as naturales del d�a en que t� o un tercero que hayas indicado, distinto del transportista, adquiera la posesi�n material del �ltimo bien, componente o pieza.

Para ejercer el derecho de desistimiento, deber�s notificarnos a Lucky's Textbooks, 715 Easy Street, 75042, Garland, Texas, U.S.A., 1 866-570-9958, de tu decisi�n de desistir del contrato a trav�s de una declaraci�n inequ�voca (por ejemplo, una carta enviada por correo postal, fax o correo electr�nico). Podr�s utilizar el modelo de formulario de desistimiento que figura a continuaci�n, aunque su uso no es obligatorio. Tienes asimismo la opci�n de cumplimentar y enviar electr�nicamente el modelo de formulario de desistimiento o cualquier otra declaraci�n inequ�voca a trav�s de nuestro sitio web a "Mis pedidos" en "Mi cuenta". Si recurres a esta opci�n, te comunicaremos sin demora en un soporte duradero (por ejemplo, por correo electr�nico) la recepci�n de dicho desistimiento.

Para cumplir el plazo de desistimiento, basta con que la comunicaci�n relativa al ejercicio por tu parte de este derecho sea enviada antes de que venza el plazo correspondiente.

Consecuencias del desistimiento:

En caso de desistimiento por tu parte, te devolveremos todos los pagos recibidos de ti, incluidos los gastos de entrega (con la excepci�n de los gastos adicionales resultantes de la elecci�n por tu parte de una modalidad de entrega diferente a la modalidad menos costosa de entrega ordinaria que ofrezcamos) sin ninguna demora indebida y, en todo caso, a m�s tardar 14 d�as naturales a partir de la fecha en la que se nos informes de tu decisi�n de desistir del presente contrato. Procederemos a efectuar dicho reembolso utilizando el mismo medio de pago empleado por ti para la transacci�n inicial, a no ser que hayas dispuesto expresamente lo contrario; en todo caso, no incurrir�s en ning�n gasto como consecuencia del reembolso.

Podremos retenerte el reembolso hasta haber recibido los bienes, o hasta que hayas presentado una prueba de la devoluci�n de los mismos, seg�n qu� condici�n se cumpla primero. Deber�s devolvernos o entregarnos directamente los bienes a Lucky's Textbooks, 715 Easy Street, 75042, Garland, Texas, U.S.A., 1 866-570-9958, sin ninguna demora indebida y, en cualquier caso, a m�s tardar en el plazo de 14 d�as naturales a partir de la fecha en que nos comuniques tu decisi�n de desistimiento del contrato. Se considerar� cumplido el plazo si efect�as la devoluci�n de los bienes antes de que haya concluido dicho plazo. Deber�s asumir el coste directo de devoluci�n de los bienes. Solo ser�s responsable de la disminuci�n de valor de los bienes resultante de una manipulaci�n distinta a la necesaria para establecer la naturaleza, las caracter�sticas y el funcionamiento de los bienes.

Excepciones al derecho de desistimiento:

La entrega de peri�dicos, publicaciones especializadas o revistas con la excepci�n de contratos de suscripci�n; y
La entrega de contenido digital (incluyendo apps, software digital e-books, MP3, etc.) que no hubiera sido entregado en un medio tangible (por ejemplo: CD o DVD), si al realizar tu pedido has aceptado que podemos proceder al env�o del producto y que no resulta posible su cancelaci�n una vez comienza la entrega.

Modelo de formulario de desistimiento

(S�lo debe cumplimentar y enviar el presente formulario si desea desistir del contrato)

A la atenci�n de: (Lucky's Textbooks, 715 Easy Street, 75042, Garland, Texas, U.S.A., 1 866-570-9958)

Por la presente le comunico/comunicamos* que desisto de mi/desistimos de nuestro* contrato de venta del siguiente bien/prestaci�n del siguiente servicio*

Pedido el/recibido el*:

Nombre del consumidor y usuario o de los consumidores y usuarios:

Domicilio del consumidor y usuario o de los consumidores y usuarios:

Firma del consumidor y usuario o de los consumidores y usuarios (solo si el presente formulario se presenta en papel):

Fecha:

* Eliminar en su caso

Condiciones de env�o

Books ordered via expedited shipping should arrive between 2 and 7 business days after shipment confirmation. Books ordered via standard shipping should arrive between 4 and 14 business days after shipment confirmation.

Tarifas de env�o en Estados Unidos de America

Tarifas de env�o en Estados Unidos de America
Cantidad del pedido	De 4 a 10 d�as h�biles	De 3 a 6 d�as h�biles
Primer art�culo	EUR 3.44	EUR 6.03

Los plazos de entrega los establecen los vendedores y var�an seg�n el transportista y la ubicaci�n. Los pedidos que pasan por la aduana pueden sufrir retrasos y los compradores son responsables de los aranceles o tarifas asociadas. Los vendedores pueden ponerse en contacto con usted en relaci�n con cargos adicionales para cubrir cualquier aumento en los costes de env�o de los art�culos.