High Performance Memory Testing: Design Principles, Fault Modeling and Self-test (Frontiers in Electronic Testing)

R. Dean Adams

Editorial: Springer, 2013
ISBN 10: 1475784740 / ISBN 13: 9781475784749
Usado / Paperback / Cantidad: 0
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reprint edition. 9.25x6.10 inches. In Stock. N° de ref. de la librería

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Sinopsis:

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Review:

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"Fulfilling a need in the industry and a need in the literature, the book is certain to stimulate a heightened research interest in memory test, memory design, and memory elf test, each of which by itself constitutes an intriguing subject. The observations and approaches of the book make it a most useful work for the professional and the researcher in helping them understand the memories that are being tested." (Current Engineering Practice, Vol. 47, 2002-2003)

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Título: High Performance Memory Testing: Design ...
Editorial: Springer
Año de publicación: 2013
Encuadernación: Paperback
Condición del libro: Brand New

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Descripción Springer, 2013. Estado de conservación: New. This item is printed on demand for shipment within 3 working days. Nº de ref. de la librería LP9781475784749

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Descripción Springer-Verlag New York Inc., 2013. PAP. Estado de conservación: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. de la librería LQ-9781475784749

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Descripción Springer-Verlag New York Inc., United States, 2013. Paperback. Estado de conservación: New. Language: English . Brand New Book ***** Print on Demand *****.Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author s 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. Softcover reprint of the original 1st ed. 2003. Nº de ref. de la librería AAV9781475784749

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Descripción Springer-Verlag New York Inc., United States, 2013. Paperback. Estado de conservación: New. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author s 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. Softcover reprint of the original 1st ed. 2003. Nº de ref. de la librería LIE9781475784749

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Descripción Springer-Verlag New York Inc., United States, 2013. Paperback. Estado de conservación: New. Language: English . Brand New Book ***** Print on Demand *****. Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author s 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. Softcover reprint of the original 1st ed. 2003. Nº de ref. de la librería AAV9781475784749

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Descripción Springer-Verlag New York Inc., 2013. PAP. Estado de conservación: New. New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. de la librería IQ-9781475784749

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Descripción Springer, 2013. Paperback. Estado de conservación: NEW. 9781475784749 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Nº de ref. de la librería HTANDREE0415676

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Descripción Springer. Paperback. Estado de conservación: New. Paperback. 250 pages. Dimensions: 9.2in. x 6.1in. x 0.6in.Are memory applications more critical than they have been in the past Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the authors 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. Nº de ref. de la librería 9781475784749

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