Artículos relacionados a Thermal Reliability of Power Semiconductor Device in...
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System (CPSS Power Electronics Series) - Tapa dura
Sinopsis
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
"Sinopsis" puede pertenecer a otra edición de este libro.
Acerca del autor
Xiong Du obtained his B.S., M.S., and Ph. D. degrees from Chongqing University, China in 2000, 2002, and 2005 respectively, all in the Electrical Engineering. He has been with Chongqing University since 2002 and is currently a full professor in the School of Electrical Engineering, Chongqing University. He was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY from July 2007 to July 2008. His research interests include power electronics system reliability and stability. He is a recipient of the National Excellent Doctoral Dissertation of P.R. China in 2008.
Jun Zhang obtained his B.S. degree from Anhui University, China, in 2014 and Ph. D. degree from Chongqing University, China, in 2019, all in the Electrical Engineering. He is currently working as a lecture in the College of Energy and Electrical Engineering, Hohai University, Nanjing, China. His research interests include the reliability of power electronics system.
De la contraportada
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
"Sobre este título" puede pertenecer a otra edición de este libro.
Comprar nuevo
Ver este artículo
EUR 136,16
EUR 19,49 gastos de envío desde Alemania a España
Destinos, gastos y plazos de envío
Resultados de la búsqueda para Thermal Reliability of Power Semiconductor Device in...
Imagen de archivo
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Publicado por
Springer Nature Singapore, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Antiguo o usado
Tapa dura
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 39028957/1
Cantidad disponible: 1 disponibles
Imagen del vendedor
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Publicado por
Springer, Berlin|Springer Nature Singapore|Springer, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Nuevo
Tapa dura
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimenta. Nº de ref. del artículo: 584145631
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Publicado por
Springer Nature Singapore Jul 2022, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Nuevo
Tapa dura
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. 188 pp. Englisch. Nº de ref. del artículo: 9789811931314
Cantidad disponible: 2 disponibles
Imagen del vendedor
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Publicado por
Springer Nature Singapore, Springer Nature Singapore, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Nuevo
Tapa dura
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. Nº de ref. del artículo: 9789811931314
Cantidad disponible: 1 disponibles
Imagen del vendedor
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Publicado por
Springer Nature Singapore, Springer Nature Singapore Jul 2022, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Nuevo
Tapa dura
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Buch. Condición: Neu. Neuware -This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch. Nº de ref. del artículo: 9789811931314
Cantidad disponible: 2 disponibles
Imagen de archivo
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Librería: Revaluation Books, Exeter, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Brand New. 188 pages. 9.25x6.10x0.63 inches. In Stock. Nº de ref. del artículo: x-9811931313
Cantidad disponible: 2 disponibles
Imagen de archivo
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System (Hardcover)
Publicado por
Springer Verlag, Singapore, Singapore, 2022
ISBN 10: 9811931313
ISBN 13: 9789811931314
Nuevo
Tapa dura
Librería: Grand Eagle Retail, Mason, OH, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: new. Hardcover. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device. This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Nº de ref. del artículo: 9789811931314
Cantidad disponible: 1 disponibles
Imagen de archivo
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System (CPSS Power Electronics Series)
Librería: Books Puddle, New York, NY, Estados Unidos de America
Calificación del vendedor: 4 de 5 estrellas
Condición: New. 1st ed. 2022 edition NO-PA16APR2015-KAP. Nº de ref. del artículo: 26396346116
Cantidad disponible: 1 disponibles
Imagen de archivo
Thermal Reliability of Power Semiconductor Device in the Renewable Energy System (CPSS Power Electronics Series)
Librería: Majestic Books, Hounslow, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Nº de ref. del artículo: 401112283
Cantidad disponible: 1 disponibles