EUR 15,91 gastos de envío desde China a Estados Unidos de America
Destinos, gastos y plazos de envíoLibrería: liu xing, Nanjing, JS, China
paperback. Condición: New. Paperback. Pub Date: 2007 08 Pages: 184 Language: Chinese in Publisher: University of Electronic Science and Technology Publishing House experimental series of textbooks. digital logic circuits. electronic circuits: experiment design. simulation. mainly include: integrated logic gate circuit parameters test . testing and application of the basic application of the integrated gate combinational logic circuit. integrated trigger timing circuit experiment. time-base circuit 555 functions and app. Nº de ref. del artículo: CB046863
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