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Sinopsis
The scaling of traditional planar CMOS devices is becoming difficult due to increasing gate leakage and subthreshold leakage. Multigate FETs have been proposed to overcome the limitations associated with the scaling of traditional CMOS devices below 100nm region. The multiple electrically coupled gates and the thin silicon body suppress the short-channel effects, thereby lowering the subthreshold leakage current in a multi-gate MOSFET. However, fabrication complexity increases for inversion mode (IM) FinFET devices due to ultra-steep doping profiles requirement. Junctionless transistor (JLT) overcomes the limitations associated with the creation of ultra-steep doping profiles during fabrication and short channel effects. In order to further reduce the SCEs, spacers at the both sides of gate are used that minimizes the leakage current. In this proposed work, JLT is designed with the use of spacer engineering i.e. changing the Lext, spacer's proportion as well as the dielectric values (к) of spacer material and its performance are evaluated from device characteristics using TCAD software tool.
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Impact of Spacer Engineering on Performance of Junctionless Transistor
Publicado por
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6139455561
ISBN 13: 9786139455560
Antiguo o usado
Tapa blanda
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Sehr gut. Zustand: Sehr gut | Seiten: 88 | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 34195478/2
Cantidad disponible: 2 disponibles
Imagen de archivo
Impact of Spacer Engineering on Performance of Junctionless Transistor
Publicado por
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6139455561
ISBN 13: 9786139455560
Antiguo o usado
Tapa blanda
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Hervorragend. Zustand: Hervorragend | Seiten: 88 | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 34195478/1
Cantidad disponible: 2 disponibles
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Impact of Spacer Engineering on Performance of Junctionless Transistor
Publicado por
LAP LAMBERT Academic Publishing Feb 2019, 2019
ISBN 10: 6139455561
ISBN 13: 9786139455560
Nuevo
Taschenbuch
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The scaling of traditional planar CMOS devices is becoming difficult due to increasing gate leakage and subthreshold leakage. Multigate FETs have been proposed to overcome the limitations associated with the scaling of traditional CMOS devices below 100nm region. The multiple electrically coupled gates and the thin silicon body suppress the short-channel effects, thereby lowering the subthreshold leakage current in a multi-gate MOSFET. However, fabrication complexity increases for inversion mode (IM) FinFET devices due to ultra-steep doping profiles requirement. Junctionless transistor (JLT) overcomes the limitations associated with the creation of ultra-steep doping profiles during fabrication and short channel effects. In order to further reduce the SCEs, spacers at the both sides of gate are used that minimizes the leakage current. In this proposed work, JLT is designed with the use of spacer engineering i.e. changing the Lext, spacer's proportion as well as the dielectric values ( ) of spacer material and its performance are evaluated from device characteristics using TCAD software tool. 88 pp. Englisch. Nº de ref. del artículo: 9786139455560
Cantidad disponible: 1 disponibles
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Impact of Spacer Engineering on Performance of Junctionless Transistor
Publicado por
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6139455561
ISBN 13: 9786139455560
Nuevo
Taschenbuch
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The scaling of traditional planar CMOS devices is becoming difficult due to increasing gate leakage and subthreshold leakage. Multigate FETs have been proposed to overcome the limitations associated with the scaling of traditional CMOS devices below 100nm region. The multiple electrically coupled gates and the thin silicon body suppress the short-channel effects, thereby lowering the subthreshold leakage current in a multi-gate MOSFET. However, fabrication complexity increases for inversion mode (IM) FinFET devices due to ultra-steep doping profiles requirement. Junctionless transistor (JLT) overcomes the limitations associated with the creation of ultra-steep doping profiles during fabrication and short channel effects. In order to further reduce the SCEs, spacers at the both sides of gate are used that minimizes the leakage current. In this proposed work, JLT is designed with the use of spacer engineering i.e. changing the Lext, spacer's proportion as well as the dielectric values ( ) of spacer material and its performance are evaluated from device characteristics using TCAD software tool. Nº de ref. del artículo: 9786139455560
Cantidad disponible: 1 disponibles
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Impact of Spacer Engineering on Performance of Junctionless Transistor
Publicado por
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6139455561
ISBN 13: 9786139455560
Nuevo
Tapa blanda
Librería: moluna, Greven, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Kaur PrabhjotPrabhjot Kaur received her B.tech in Electronics and communication engineering From Guru Nanak Dev Engineering College, Ludhiana in 2016. From the same college, She received M.tech degree in 2018. Her major research area. Nº de ref. del artículo: 385859189
Cantidad disponible: Más de 20 disponibles
Imagen del vendedor
Impact of Spacer Engineering on Performance of Junctionless Transistor
Publicado por
LAP LAMBERT Academic Publishing Feb 2019, 2019
ISBN 10: 6139455561
ISBN 13: 9786139455560
Nuevo
Taschenbuch
Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania
Calificación del vendedor: 5 de 5 estrellas
Taschenbuch. Condición: Neu. Neuware -The scaling of traditional planar CMOS devices is becoming difficult due to increasing gate leakage and subthreshold leakage. Multigate FETs have been proposed to overcome the limitations associated with the scaling of traditional CMOS devices below 100nm region. The multiple electrically coupled gates and the thin silicon body suppress the short-channel effects, thereby lowering the subthreshold leakage current in a multi-gate MOSFET. However, fabrication complexity increases for inversion mode (IM) FinFET devices due to ultra-steep doping profiles requirement. Junctionless transistor (JLT) overcomes the limitations associated with the creation of ultra-steep doping profiles during fabrication and short channel effects. In order to further reduce the SCEs, spacers at the both sides of gate are used that minimizes the leakage current. In this proposed work, JLT is designed with the use of spacer engineering i.e. changing the Lext, spacer¿s proportion as well as the dielectric values (¿) of spacer material and its performance are evaluated from device characteristics using TCAD software tool.Books on Demand GmbH, Überseering 33, 22297 Hamburg 88 pp. Englisch. Nº de ref. del artículo: 9786139455560
Cantidad disponible: 2 disponibles