Artículos relacionados a Scanning Tunneling Microscope and Atomic Force Microscopy

Scanning Tunneling Microscope and Atomic Force Microscopy - Tapa blanda

 
9783668588264: Scanning Tunneling Microscope and Atomic Force Microscopy

Sinopsis

Literature Review from the year 2015 in the subject Engineering - General, Basics, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist's lab in form of ambient

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

Literature Review from the year 2015 in the subject Engineering - General, Basics, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist's lab in form of ambient

"Sobre este título" puede pertenecer a otra edición de este libro.

  • EditorialGRIN Publishing
  • Año de publicación2017
  • ISBN 10 3668588260
  • ISBN 13 9783668588264
  • EncuadernaciónTapa blanda
  • IdiomaInglés
  • Número de edición1
  • Número de páginas24
  • Contacto del fabricanteno disponible

Comprar nuevo

Ver este artículo

EUR 11,00 gastos de envío desde Alemania a España

Destinos, gastos y plazos de envío

Resultados de la búsqueda para Scanning Tunneling Microscope and Atomic Force Microscopy

Imagen del vendedor

Suchit Sharma
Publicado por GRIN Publishing Dez 2017, 2017
ISBN 10: 3668588260 ISBN 13: 9783668588264
Nuevo Taschenbuch
Impresión bajo demanda

Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Literature Review from the year 2015 in the subject Engineering - General, Basics, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical 'touch' while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist's lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide. 20 pp. Englisch. Nº de ref. del artículo: 9783668588264

Contactar al vendedor

Comprar nuevo

EUR 13,99
Convertir moneda
Gastos de envío: EUR 11,00
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 2 disponibles

Añadir al carrito

Imagen del vendedor

Suchit Sharma
Publicado por GRIN Publishing, 2017
ISBN 10: 3668588260 ISBN 13: 9783668588264
Nuevo Taschenbuch
Impresión bajo demanda

Librería: AHA-BUCH GmbH, Einbeck, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Literature Review from the year 2015 in the subject Engineering - General, Basics, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical 'touch' while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist's lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide. Nº de ref. del artículo: 9783668588264

Contactar al vendedor

Comprar nuevo

EUR 13,99
Convertir moneda
Gastos de envío: EUR 11,99
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 1 disponibles

Añadir al carrito

Imagen del vendedor

Suchit Sharma
Publicado por GRIN Verlag, GRIN Verlag Dez 2017, 2017
ISBN 10: 3668588260 ISBN 13: 9783668588264
Nuevo Taschenbuch

Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. Neuware -Literature Review from the year 2015 in the subject Engineering - General, Basics, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation.These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed.Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical 'touch' while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyist¿s lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations.The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide.BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt 20 pp. Englisch. Nº de ref. del artículo: 9783668588264

Contactar al vendedor

Comprar nuevo

EUR 13,99
Convertir moneda
Gastos de envío: EUR 19,99
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 2 disponibles

Añadir al carrito

Imagen de archivo

Sharma, Suchit
Publicado por Grin Verlag, 2017
ISBN 10: 3668588260 ISBN 13: 9783668588264
Nuevo Tapa blanda

Librería: California Books, Miami, FL, Estados Unidos de America

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. Nº de ref. del artículo: I-9783668588264

Contactar al vendedor

Comprar nuevo

EUR 33,35
Convertir moneda
Gastos de envío: EUR 7,00
De Estados Unidos de America a España
Destinos, gastos y plazos de envío

Cantidad disponible: Más de 20 disponibles

Añadir al carrito

Imagen del vendedor

Suchit Sharma
Publicado por GRIN Verlag, 2017
ISBN 10: 3668588260 ISBN 13: 9783668588264
Nuevo Taschenbuch
Impresión bajo demanda

Librería: preigu, Osnabrück, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. Scanning Tunneling Microscope and Atomic Force Microscopy | Suchit Sharma | Taschenbuch | 20 S. | Englisch | 2017 | GRIN Verlag | EAN 9783668588264 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu Print on Demand. Nº de ref. del artículo: 110727046

Contactar al vendedor

Comprar nuevo

EUR 13,99
Convertir moneda
Gastos de envío: EUR 55,00
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 5 disponibles

Añadir al carrito

Imagen de archivo

Sharma, Suchit
Publicado por Grin Verlag, 2017
ISBN 10: 3668588260 ISBN 13: 9783668588264
Nuevo Tapa blanda

Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. Nº de ref. del artículo: ABLIING23Mar3113020323279

Contactar al vendedor

Comprar nuevo

EUR 29,18
Convertir moneda
Gastos de envío: EUR 65,64
De Estados Unidos de America a España
Destinos, gastos y plazos de envío

Cantidad disponible: Más de 20 disponibles

Añadir al carrito